Inventor

BROCHU JR DAVID G

US4 patents

⚠️ This page may combine multiple inventors who share the name “BROCHU JR DAVID G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BROCHU JR DAVID G

2 patents

US8587383B2Nov 19, 2013

Measuring bias temperature instability induced ring oscillator frequency degradation

BROCHU JR DAVID G6 citations65

US8754655B2Jun 17, 2014

Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration

BROCHU JR DAVID G3 citations56

IBM

1 patent

US9059281B2Jun 16, 2015

Dual L-shaped drift regions in an LDMOS device and method of making the same

IBM4 citations71

GLOBALFOUNDRIES INC

1 patent

US10103060B2Oct 16, 2018

Test structures for dielectric reliability evaluations

GLOBALFOUNDRIES INC0 citations50