Inventor
TAGUCHI TAKEYOSHI
JP7 patents
Patents
7 patentsUS6456688B1Sep 24, 2002
X-ray spectrometer and apparatus for XAFS measurements
RIGAKU DENKI CO LTD59 citations91
US6529578B1Mar 4, 2003
X-ray condenser and x-ray apparatus
RIGAKU DENKI CO LTD30 citations87
US7535992B2May 19, 2009
X-ray diffraction apparatus
RIGAKU DENKI CO LTD10 citations82
US7145983B2Dec 5, 2006
X-ray analysis apparatus
RIGAKU DENKI CO LTD10 citations65
US10551510B2Feb 4, 2020
Data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and program
RIGAKU DENKI CO LTD1 citations59
US6738453B2May 18, 2004
Hot cathode of X-ray tube
RIGAKU DENKI CO LTD2 citations55
US7209541B2Apr 24, 2007
X-ray analysis apparatus
RIGAKU DENKI CO LTD0 citations39