Inventor
GLASER ULRICH
DE20 patents
⚠️ This page may combine multiple inventors who share the name “GLASER ULRICH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
16 patentsUS9413166B2Aug 9, 2016
Noise-tolerant active clamp with ESD protection capability in power up mode
INFINEON TECHNOLOGIES AG24 citations93
US9705026B2Jul 11, 2017
Method of triggering avalanche breakdown in a semiconductor device
INFINEON TECHNOLOGIES AG16 citations91
US9225163B2Dec 29, 2015
Combined ESD active clamp for cascaded voltage pins
INFINEON TECHNOLOGIES AG24 citations91
US9287377B2Mar 15, 2016
Semiconductor device and manufacturing method
INFINEON TECHNOLOGIES AG4 citations73
US9953968B2Apr 24, 2018
Integrated circuit having an ESD protection structure and photon source
INFINEON TECHNOLOGIES AG4 citations71
US9159719B2Oct 13, 2015
ESD protection
INFINEON TECHNOLOGIES AG4 citations69
US10367350B2Jul 30, 2019
Central combined active ESD clamp
INFINEON TECHNOLOGIES AG3 citations68
US7279726B2Oct 9, 2007
ESD protection device
INFINEON TECHNOLOGIES AG4 citations62
US9263619B2Feb 16, 2016
Semiconductor component and method of triggering avalanche breakdown
INFINEON TECHNOLOGIES AG2 citations61
US10971488B2Apr 6, 2021
Active ESD clamp deactivation
INFINEON TECHNOLOGIES AG0 citations60
US8901647B2Dec 2, 2014
Semiconductor device including first and second semiconductor elements
INFINEON TECHNOLOGIES AG2 citations58
US9947648B2Apr 17, 2018
Semiconductor device including a diode at least partly arranged in a trench
INFINEON TECHNOLOGIES AG0 citations52
US7888701B2Feb 15, 2011
Integrated circuit arrangement with Shockley diode or thyristor and method for production and use of a thyristor
INFINEON TECHNOLOGIES AG0 citations52
US7679103B2Mar 16, 2010
Integrated circuit arrangement with shockley diode or thyristor and method for production and use of a thyristor
INFINEON TECHNOLOGIES AG0 citations52
US11316340B2Apr 26, 2022
Electrostatic discharge with parasitic compensation
INFINEON TECHNOLOGIES AG0 citations51
US9891268B2Feb 13, 2018
Apparatus and method for generating signals for ESD stress testing an electronic device and system for performing an ESD stress test of an electronic device
INFINEON TECHNOLOGIES AG1 citations49