Inventor

AHRENS HEIKO

DE7 patents

⚠️ This page may combine multiple inventors who share the name “AHRENS HEIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INFINEON TECHNOLOGIES AG

3 patents

US11619668B2Apr 4, 2023

Integrated circuit with self-test circuit, method for operating an integrated circuit with self-test circuit, multi-core processor device and method for operating a multi-core processor device

INFINEON TECHNOLOGIES AG0 citations45

US12055587B2Aug 6, 2024

Integrated test circuit, test assembly and method for testing an integrated circuit

INFINEON TECHNOLOGIES AG0 citations42

US11874325B2Jan 16, 2024

Integrated circuit, test assembly and method for testing an integrated circuit

INFINEON TECHNOLOGIES AG0 citations42

REGNER MARKUS

2 patents

US9529047B2Dec 27, 2016

Integrated circuit device and method of performing self-testing within an integrated circuit device

REGNER MARKUS2 citations54

US9091726B1Jul 28, 2015

Method and apparatus for performing self-testing within an IC device

REGNER MARKUS2 citations54

LITOVCHENKO VLADIMIR

1 patent

US9435862B2Sep 6, 2016

Integrated circuit device and method therefor

LITOVCHENKO VLADIMIR1 citations31

AHRENS HEIKO

1 patent

US9448283B2Sep 20, 2016

Circuit arrangement for logic built-in self-test of a semiconductor device and a method of operating such circuit arrangement

AHRENS HEIKO0 citations25