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Inventor
VORISEK VLADIMIR
DE
2 patents
Patents
2 patents
US9529047B2
Dec 27, 2016
Integrated circuit device and method of performing self-testing within an integrated circuit device
REGNER MARKUS
2 citations
54
US9091726B1
Jul 28, 2015
Method and apparatus for performing self-testing within an IC device
REGNER MARKUS
2 citations
54