Inventor
HUANG CHUNG-LI
TW6 patents
⚠️ This page may combine multiple inventors who share the name “HUANG CHUNG-LI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
4 patentsUS10361286B2Jul 23, 2019
Method and structure for mandrel and spacer patterning
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations79
US11071513B2Jul 27, 2021
Test key design to enable X-ray scatterometry measurement
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations68
US10499876B2Dec 10, 2019
Test key design to enable X-ray scatterometry measurement
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations68
US10818779B2Oct 27, 2020
Method and structure for mandrel and spacer patterning
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47