Inventor
LIN HWAY-CHI
TW5 patents
Patents
5 patentsUS6291872B1Sep 18, 2001
Three-dimensional type inductor for mixed mode radio frequency device
TAIWAN SEMICONDUCTOR MFG99 citations97
US6232043B1May 15, 2001
Rule to determine CMP polish time
TAIWAN SEMICONDUCTOR MFG9 citations73
US6514673B2Feb 4, 2003
Rule to determine CMP polish time
TAIWAN SEMICONDUCTOR MFG4 citations62
US7157367B2Jan 2, 2007
Device structure having enhanced surface adhesion and failure mode analysis
TAIWAN SEMICONDUCTOR MFG2 citations61
US7449911B2Nov 11, 2008
Method for determining electro-migration failure mode
TAIWAN SEMICONDUCTOR MFG4 citations54