Inventor
NIKAWA KIYOSHI
JP23 patents
⚠️ This page may combine multiple inventors who share the name “NIKAWA KIYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
15 patentsUS6028435AFeb 22, 2000
Semiconductor device evaluation system using optical fiber
NEC CORP159 citations99
US6320396B1Nov 20, 2001
Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device
NEC CORP109 citations98
US6160407ADec 12, 2000
Inspection method and wiring current observation method for semiconductor device and apparatus of the same
NEC CORP107 citations98
US6444895B1Sep 3, 2002
Device and method for nondestructive inspection on semiconductor device
NEC CORP74 citations96
US6066956AMay 23, 2000
Inspection method and wiring current observation method for semiconductor device
NEC CORP55 citations96
US5804980ASep 8, 1998
Method and system for testing an interconnection in a semiconductor integrated circuit
NEC CORP74 citations96
US5422498AJun 6, 1995
Apparatus for diagnosing interconnections of semiconductor integrated circuits
NEC CORP70 citations94
US5815002ASep 29, 1998
Method and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairs
NEC CORP45 citations92
US5548211AAug 20, 1996
Dynamic fault imaging system using electron beam and method of analyzing fault
NEC CORP41 citations89
US6593156B2Jul 15, 2003
Non-destructive inspection method
NEC CORP17 citations84
US6137304AOct 24, 2000
Method and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairs
NEC CORP5 citations74
US4734754AMar 29, 1988
Semiconductor device having improved structure of multi-wiring layers
NEC CORP9 citations74
US5521516AMay 28, 1996
Semiconductor integrated circuit fault analyzing apparatus and method therefor
NEC CORP14 citations72
US6084423AJul 4, 2000
Method and device of testing a semiconductor integrated circuit chip in which a voltage across the semiconductor integrated circuit chip is detected while an ultrasonic wave beam is projected thereon
NEC CORP1 citations63
US6072327AJun 6, 2000
Method and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairs
NEC CORP2 citations63
NEC ELECTRONICS CORP
7 patentsUS7825673B2Nov 2, 2010
Failure analysis method and failure analysis apparatus
NEC ELECTRONICS CORP11 citations84
US6759259B2Jul 6, 2004
Device and method for nondestructive inspection on semiconductor device
NEC ELECTRONICS CORP5 citations74
US6610918B2Aug 26, 2003
Device and method for nondestructive inspection on semiconductor device
NEC ELECTRONICS CORP4 citations63
US7173447B2Feb 6, 2007
Method and apparatus for diagnosing fault in semiconductor device
NEC ELECTRONICS CORP6 citations59
US7495449B2Feb 24, 2009
Non-destructive testing apparatus and non-destructive testing method
NEC ELECTRONICS CORP1 citations52
US7484883B2Feb 3, 2009
Non-destructive testing apparatus and non-destructive testing method
NEC ELECTRONICS CORP0 citations52
US7250758B2Jul 31, 2007
Inspection method and apparatus using scanning laser SQUID microscope
NEC ELECTRONICS CORP0 citations42