Inventor

MIWA TADASHI

JP34 patents

⚠️ This page may combine multiple inventors who share the name “MIWA TADASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MIWA TADASHI

KONISHIROKU PHOTO IND

Color image forming method

Electrostatic reproducing apparatus having an intermediate toner image transfer member

Recording apparatus having water vapor removing or preventing means

Cleaning roller intermediate transfer member

Recording apparatus for electrostatic images

Recording apparatus

Rotational body driving apparatus and an image forming apparatus in use therewith

Damping device for rotating members

Color image forming apparatus with photoreceptor protector

Driving apparatus for a rotary body in use with an image forming apparatus

Color image forming apparatus

Exposure unit for a multicolor image forming apparatus capable of better registration of the multicolor images

Fixing apparatus having two nip regions

Image reproducing apparatus

Method and apparatus for transferring and fixing toner image using controlled heat

Image forming apparatus having a rotatable photoreceptor

Developing apparatus in use with an image forming apparatus

Automatic sheet-feeder

Image forming apparatus with edge point detector based on image density charge

Image forming apparatus

Driving device of rotational body for use in image forming apparatus

Developer layer forming method

Developing electrophotographic image using magnets and magnetic material

Toner image transfer to multilayer intermediate transfer body

Photoreceptor for a copier having suppressed fluctuation component

Automatic sheet feeding apparatus

Rotation control device

Electromagnetic clutch

TOSHIBA KK

Semiconductor device and manufacturing method thereof

Semiconductor inspecting system, semiconductor defect analyzing system, semiconductor design data modifying system, semiconductor inspecting method, semiconductor defect analyzing method, semiconductor design data modifying method, and computer readable recorded medium

Semiconductor inspecting system, method and computer

Semiconductor device manufacturing method

Method of manufacturing semiconductor device with an improved wiring layer structure

Semiconductor device and manufacturing method thereof