Inventor
BICKFORD JEANNE
US5 patents
⚠️ This page may combine multiple inventors who share the name “BICKFORD JEANNE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
4 patentsUS7386815B2Jun 10, 2008
Test yield estimate for semiconductor products created from a library
IBM9 citations83
US7810054B2Oct 5, 2010
Method of optimizing power usage of an integrated circuit design by tuning selective voltage binning cut point
IBM11 citations82
US8010916B2Aug 30, 2011
Test yield estimate for semiconductor products created from a library
IBM2 citations61
US10794952B2Oct 6, 2020
Product performance test binning
IBM0 citations50