Inventor
YAMOTO HIROAKI
US19 patents
Patents
19 patentsUS6678645B1Jan 13, 2004
Method and apparatus for SoC design validation
ADVANTEST CORP276 citations99
US6249893B1Jun 19, 2001
Method and structure for testing embedded cores based system-on-a-chip
ADVANTEST CORP199 citations99
US6678643B1Jan 13, 2004
Event based semiconductor test system
ADVANTEST CORP55 citations96
US6651204B1Nov 18, 2003
Modular architecture for memory testing on event based test system
ADVANTEST CORP64 citations96
US6532561B1Mar 11, 2003
Event based semiconductor test system
ADVANTEST CORP62 citations96
US7089517B2Aug 8, 2006
Method for design validation of complex IC
ADVANTEST CORP23 citations92
US6631340B2Oct 7, 2003
Application specific event based semiconductor memory test system
ADVANTEST CORP27 citations92
US6249892B1Jun 19, 2001
Circuit structure for testing microprocessors and test method thereof
ADVANTEST CORP37 citations92
US6249889B1Jun 19, 2001
Method and structure for testing embedded memories
ADVANTEST CORP44 citations92
US6370675B1Apr 9, 2002
Semiconductor integrated circuit design and evaluation system using cycle base timing
ADVANTEST CORP32 citations91
US6061283AMay 9, 2000
Semiconductor integrated circuit evaluation system
ADVANTEST CORP37 citations91
US5951704ASep 14, 1999
Test system emulator
ADVANTEST CORP40 citations91
US7178115B2Feb 13, 2007
Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing
ADVANTEST CORP15 citations84
US6249891B1Jun 19, 2001
High speed test pattern evaluation apparatus
ADVANTEST CORP18 citations83
US7089135B2Aug 8, 2006
Event based IC test system
ADVANTEST CORP15 citations82
US5828985AOct 27, 1998
Semiconductor test system
ADVANTEST CORP12 citations72
US6944808B2Sep 13, 2005
Method of evaluating core based system-on-a-chip
ADVANTEST CORP5 citations63
US7596730B2Sep 29, 2009
Test method, test system and assist board
ADVANTEST CORP4 citations61
US6791316B2Sep 14, 2004
High speed semiconductor test system using radially arranged pin cards
ADVANTEST CORP1 citations52