Inventor
KITAMURA SHOJI
JP20 patents
⚠️ This page may combine multiple inventors who share the name “KITAMURA SHOJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJI ELECTRIC CO LTD
19 patentsUS5485479AJan 16, 1996
Semiconductor laser device encapsulated in a transparent resin layer
FUJI ELECTRIC CO LTD34 citations92
US5907571AMay 25, 1999
Semiconductor laser device and method for manufacturing the same
FUJI ELECTRIC CO LTD29 citations89
US5825794AOct 20, 1998
Semiconductor laser device
FUJI ELECTRIC CO LTD38 citations89
US5614735AMar 25, 1997
Semiconductor laser device
FUJI ELECTRIC CO LTD43 citations88
US5590144ADec 31, 1996
Semiconductor laser device
FUJI ELECTRIC CO LTD15 citations82
US5444726AAug 22, 1995
Semiconductor laser device
FUJI ELECTRIC CO LTD13 citations73
US9337282B2May 10, 2016
Semiconductor device with point defect region doped with transition metal
FUJI ELECTRIC CO LTD4 citations72
US11728377B2Aug 15, 2023
Semiconductor device
FUJI ELECTRIC CO LTD0 citations62
US11257900B2Feb 22, 2022
Semiconductor device
FUJI ELECTRIC CO LTD0 citations62
US6707131B2Mar 16, 2004
Semiconductor device and manufacturing method for the same
FUJI ELECTRIC CO LTD6 citations62
US5488623AJan 30, 1996
Mold-type semiconductor laser device with reduced light-emitting point displacement during operation
FUJI ELECTRIC CO LTD5 citations62
US11087986B2Aug 10, 2021
Semiconductor device manufacturing method and semiconductor device
FUJI ELECTRIC CO LTD0 citations57
US10700167B2Jun 30, 2020
Semiconductor device having an ohmic electrode including a nickel silicide layer
FUJI ELECTRIC CO LTD1 citations56
US10727304B2Jul 28, 2020
Semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US10374043B2Aug 6, 2019
Semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US9680034B2Jun 13, 2017
Manufacturing method for semiconductor device with point defect region doped with transition metal
FUJI ELECTRIC CO LTD0 citations51
US9222970B2Dec 29, 2015
Fault position analysis method and fault position analysis device for semiconductor device
FUJI ELECTRIC CO LTD1 citations47
US10622212B2Apr 14, 2020
Semiconductor device manufacturing method and semiconductor device
FUJI ELECTRIC CO LTD0 citations46
US10396162B2Aug 27, 2019
Silicon carbide semiconductor device
FUJI ELECTRIC CO LTD0 citations41