Inventor
ECKELMAN JOSEPH E
US3 patents
Patents
3 patentsUS7076706B2Jul 11, 2006
Method and apparatus for ABIST diagnostics
IBM10 citations70
US6751765B1Jun 15, 2004
Method and system for determining repeatable yield detractors of integrated circuits
IBM10 citations69
US7765445B2Jul 27, 2010
Analog testing of ring oscillators using built-in self test apparatus
IBM7 citations64