Inventor

CHOI WOON-SUP

KR5 patents

⚠️ This page may combine multiple inventors who share the name “CHOI WOON-SUP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

3 patents

US10088521B2Oct 2, 2018

Test board for semiconductor package, test system, and method of manufacturing semiconductor package

SAMSUNG ELECTRONICS CO LTD6 citations67

US7816937B2Oct 19, 2010

Apparatus for testing a semiconductor package

SAMSUNG ELECTRONICS CO LTD3 citations58

US10203369B2Feb 12, 2019

Test board, test equipment, test system, and test method

SAMSUNG ELECTRONICS CO LTD0 citations48

CHOI WOON-SUP

1 patent

US8476908B2Jul 2, 2013

Signal capture system and test apparatus including the same

CHOI WOON-SUP3 citations53

CHOI IN-HO

1 patent

US8103927B2Jan 24, 2012

Field mounting-type test apparatus and method for testing memory component or module in actual PC environment

CHOI IN-HO1 citations49