Inventor

JANG CHUL-WOONG

KR4 patents

⚠️ This page may combine multiple inventors who share the name “JANG CHUL-WOONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

2 patents

US7772828B2Aug 10, 2010

Automatic test equipment capable of high speed test

SAMSUNG ELECTRONICS CO LTD11 citations83

US7816937B2Oct 19, 2010

Apparatus for testing a semiconductor package

SAMSUNG ELECTRONICS CO LTD3 citations58

CHOI WOON-SUP

1 patent

US8476908B2Jul 2, 2013

Signal capture system and test apparatus including the same

CHOI WOON-SUP3 citations53

CHOI IN-HO

1 patent

US8103927B2Jan 24, 2012

Field mounting-type test apparatus and method for testing memory component or module in actual PC environment

CHOI IN-HO1 citations49