Inventor
CONTI DENNIS R
US11 patents
⚠️ This page may combine multiple inventors who share the name “CONTI DENNIS R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
10 patentsUS6275051B1Aug 14, 2001
Segmented architecture for wafer test and burn-in
IBM127 citations96
US6847203B1Jan 25, 2005
Applying parametric test patterns for high pin count ASICs on low pin count testers
IBM84 citations93
US4751656AJun 14, 1988
Method for choosing replacement lines in a two dimensionally redundant array
IBM45 citations86
US10261108B2Apr 16, 2019
Low force wafer test probe with variable geometry
IBM3 citations72
US11009545B2May 18, 2021
Integrated circuit tester probe contact liner
IBM0 citations62
US11029334B2Jun 8, 2021
Low force wafer test probe
IBM0 citations61
US10670653B2Jun 2, 2020
Integrated circuit tester probe contact liner
IBM0 citations51
US10663487B2May 26, 2020
Low force wafer test probe with variable geometry
IBM0 citations51
US10444260B2Oct 15, 2019
Low force wafer test probe
IBM0 citations51
US7265561B2Sep 4, 2007
Device burn in utilizing voltage control
IBM1 citations49