Inventor

LIN YEA-SEN

US4 patents

⚠️ This page may combine multiple inventors who share the name “LIN YEA-SEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

3 patents

US7765518B2Jul 27, 2010

System and method for implementing optical rule checking to identify and quantify corner rounding errors

IBM2 citations50

US5159409AOct 27, 1992

Substrate machining verifier

IBM1 citations43

US5198878AMar 30, 1993

Substrate machining verifier

IBM0 citations35

GLOBALFOUNDRIES US INC

1 patent

US11205648B2Dec 21, 2021

IC structure with single active region having different doping profile than set of active regions

GLOBALFOUNDRIES US INC1 citations51