Inventor
MASUO YOSHIYUKI
JP7 patents
Patents
7 patentsUS6104183AAug 15, 2000
Semiconductor device testing apparatus
ADVANTEST CORP62 citations96
US6856128B2Feb 15, 2005
Semiconductor device testing apparatus and a test tray for use in the testing apparatus
ADVANTEST CORP19 citations92
US6384593B1May 7, 2002
Semiconductor device testing apparatus
ADVANTEST CORP40 citations92
US6384360B1May 7, 2002
IC pickup, IC carrier and IC testing apparatus using the same
ADVANTEST CORP24 citations92
US7919974B2Apr 5, 2011
Electronic device test apparatus and method of configuring electronic device test apparatus
ADVANTEST CORP10 citations82
US6459259B1Oct 1, 2002
Tester for semiconductor devices and test tray used for the same
ADVANTEST CORP13 citations73
USD442568SMay 22, 2001
IC module insert
ADVANTEST CORP3 citations62