Inventor
SHKALIM Ariel
IL8 patents
Patents
8 patentsUS9613255B2Apr 4, 2017
Systems, methods and computer program products for signature detection
APPLIED MATERIALS ISRAEL LTD11 citations82
US11276160B2Mar 15, 2022
Determining a critical dimension variation of a pattern
APPLIED MATERIALS ISRAEL LTD2 citations70
US11348224B2May 31, 2022
Mask inspection of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD2 citations64
US11756188B2Sep 12, 2023
Determining a critical dimension variation of a pattern
APPLIED MATERIALS ISRAEL LTD0 citations59
US10290087B2May 14, 2019
Method of generating an examination recipe and system thereof
APPLIED MATERIALS ISRAEL LTD1 citations57
US11983867B2May 14, 2024
Mask inspection of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations54
US12400314B2Aug 26, 2025
Mask inspection for semiconductor specimen fabrication
APPLIED MATERIALS ISRAEL LTD0 citations47
US12361535B2Jul 15, 2025
Mask inspection for semiconductor specimen fabrication
APPLIED MATERIALS ISRAEL LTD0 citations40