Inventor · disambiguated record
Kazuyuki Miyashita
Also filed as: MIYASHITA KAZUYUKI
11 granted patents·5 pending applications·987 citations·filing 2003–2023
89Inventor score
Top patents by PatentIndex Score
16 records- 0197US7781964B2Organic electroluminescent device and electronic apparatusSEIKO EPSON CORP·Filed 2007·Granted Aug 24, 2010·50 cites·16 claims
- 0297US7427672B2Artificial nucleic acids of n-o bond crosslinkage typeIMANISHI TAKESHI·Filed 2004·Granted Sep 23, 2008·868 cites·20 claims
- 0394US7435633B2Electroluminescence device, manufacturing method thereof, and electronic apparatusSEIKO EPSON CORP·Filed 2007·Granted Oct 14, 2008·41 cites·11 claims
- 0489US7948616B2Measurement method, exposure method and device manufacturing methodNIKON CORP·Filed 2008·Granted May 24, 2011·13 cites·33 claims
- 0573US2024036221A1Setting method, inspection method, defect evaluation device and structure manufacturing methodNIKON CORP·Filed 2023·Application pending·0 cites
- 0668US6706456B2Method of determining exposure conditions, exposure method, device manufacturing method, and storage mediumNIKON CORP·Filed 2003·Granted Mar 16, 2004·14 cites·52 claims
- 0765US11927916B2Watch component, watch movement and watchSEIKO EPSON CORP·Filed 2020·Granted Mar 12, 2024·0 cites·20 claims
- 0861US7192821B2Manufacturing process of semi-conductor deviceSEIKO EPSON CORP·Filed 2005·Granted Mar 20, 2007·1 cites·11 claims
- 0960US2019310385A1Setting method, inspection method, defect evaluation device and structure manufacturing methodNIKON CORP·Filed 2019·Application pending·0 cites
- 1053US9255845B2Infrared detecting element, method for manufacturing infrared detecting element, and electronic deviceSEIKO EPSON CORP·Filed 2015·Granted Feb 9, 2016·0 cites·9 claims
- 1149US10705258B2Antireflection film, optical device, and production method for antireflection filmSEIKO EPSON CORP·Filed 2018·Granted Jul 7, 2020·0 cites·11 claims
- 1247US2009233195A1Linewidth measuring method, image-forming-state detecting method, adjustment method, exposure method, and device manufacturing methodNIKON CORP·Filed 2009·Application pending·0 cites
- 1345US8957375B2Infrared detecting element, method for manufacturing infrared detecting element, and electronic deviceMIYASHITA KAZUYUKI·Filed 2012·Granted Feb 17, 2015·0 cites·5 claims
- 1445US2008208499A1Optical characteristics measurement method, exposure method and device manufacturing method, and inspection apparatus and measurement methodNIKON CORP·Filed 2008·Application pending·0 cites
- 1543US7220659B2Method for manufacturing a semiconductor deviceSEIKO EPSON CORP·Filed 2005·Granted May 22, 2007·0 cites·5 claims
- 1630US2004179190A1Optical properties measurement method, exposure method, and device manufacturing methodNIKON CORP·Filed 2003·Application pending·0 cites
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