Inventor

TSEN ANDY

TW12 patents

⚠️ This page may combine multiple inventors who share the name “TSEN ANDY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TSEN ANDY

4 patents

US8108060B2Jan 31, 2012

System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture

TSEN ANDY25 citations90

US8229588B2Jul 24, 2012

Method and system for tuning advanced process control parameters

TSEN ANDY32 citations89

US8394719B2Mar 12, 2013

System and method for implementing multi-resolution advanced process control

TSEN ANDY9 citations80

US8219341B2Jul 10, 2012

System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model

TSEN ANDY2 citations60

TSAI PO-FENG

3 patents

US8437870B2May 7, 2013

System and method for implementing a virtual metrology advanced process control platform

TSAI PO-FENG31 citations90

US8224475B2Jul 17, 2012

Method and apparatus for advanced process control

TSAI PO-FENG10 citations82

US8396583B2Mar 12, 2013

Method and system for implementing virtual metrology in semiconductor fabrication

TSAI PO-FENG6 citations72

TAIWAN SEMICONDUCTOR MFG

2 patents

US8041451B2Oct 18, 2011

Method for bin-based control

TAIWAN SEMICONDUCTOR MFG9 citations82

US7951615B2May 31, 2011

System and method for implementing multi-resolution advanced process control

TAIWAN SEMICONDUCTOR MFG2 citations61

LIN CHUN-HSIEN

1 patent

US8082055B2Dec 20, 2011

Method for a bin ratio forecast at new tape out stage

LIN CHUN-HSIEN7 citations83

HSU CHIH-WEI

1 patent

US8239056B2Aug 7, 2012

Advanced process control for new tapeout product

HSU CHIH-WEI2 citations61

FEI WANG JO

1 patent

US8392009B2Mar 5, 2013

Advanced process control with novel sampling policy

FEI WANG JO4 citations54