Inventor
KUBOI NOBUYUKI
JP29 patents
⚠️ This page may combine multiple inventors who share the name “KUBOI NOBUYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SONY CORP
12 patentsUS9431310B2Aug 30, 2016
Simulation method, simulation program, process control system, simulator, process design method, and mask design method
SONY CORP6 citations73
US9189577B2Nov 17, 2015
Simulation method, simulation program, processing unit, and simulator
SONY CORP4 citations73
US9609228B2Mar 28, 2017
Solid-state image pickup device with transmittance control element
SONY CORP5 citations72
US9437636B2Sep 6, 2016
Solid-state imaging element, manufacturing method, and electronic device
SONY CORP3 citations72
US9666623B2May 30, 2017
Imaging element, method for manufacturing imaging element, pixel design method, and electronic apparatus with light collecting parts having plural projection and depression structures
SONY CORP1 citations62
US8829410B2Sep 9, 2014
Solid-state imaging device, manufacturing method thereof, and electronic apparatus
SONY CORP2 citations62
US8845913B2Sep 30, 2014
Ion radiation damage prediction method, ion radiation damage simulator, ion radiation apparatus and ion radiation method
SONY CORP0 citations52
US8747685B2Jun 10, 2014
Shape simulation apparatus, shape simulation program, semiconductor production apparatus, and semiconductor device production method
SONY CORP0 citations52
US10929579B2Feb 23, 2021
Film formation simulation method, program, and semiconductor processing system
SONY CORP0 citations51
US10821260B2Nov 3, 2020
State control apparatus, state control method, and state control system
SONY CORP0 citations42
US9881104B2Jan 30, 2018
Simulating shape of a workpiece based on a flux
SONY CORP0 citations42
US9287097B2Mar 15, 2016
Predicting ultraviolet ray damage with visible wavelength spectroscopy during a semiconductor manufacturing process
SONY CORP0 citations41
KUBOI NOBUYUKI
9 patentsUS8545710B2Oct 1, 2013
Ion radiation damage prediction method, ion radiation damage simulator, ion radiation apparatus and ion radiation method
KUBOI NOBUYUKI14 citations83
US8535550B2Sep 17, 2013
Shape simulation apparatus, shape simulation program, semiconductor production apparatus, and semiconductor device production method
KUBOI NOBUYUKI2 citations62
US8759738B2Jun 24, 2014
Imaging element having plural light collecting parts each including a specific projection and depression structure, method for manufacturing imaging element, pixel design method, and electronic apparatus
KUBOI NOBUYUKI2 citations61
US8618460B2Dec 31, 2013
Solid-state imaging device, manufacturing method thereof, and electronic apparatus
KUBOI NOBUYUKI2 citations61
US10998174B2May 4, 2021
Dry etching equipment and method for producing semiconductor device
KUBOI NOBUYUKI0 citations51
US8958073B2Feb 17, 2015
Imaging apparatus, electronic apparatus, photovoltaic cell, and method of manufacturing imaging apparatus
KUBOI NOBUYUKI0 citations51
US10074517B2Sep 11, 2018
Plasma treatment method, plasma treatment apparatus, and semiconductor device manufacturing method
KUBOI NOBUYUKI0 citations41
US9411914B2Aug 9, 2016
Simulator, processing system, damage evaluation method and damage evaluation program
KUBOI NOBUYUKI0 citations40
US8649893B2Feb 11, 2014
Semiconductor manufacturing device, semiconductor device manufacturing method, simulation device, and simulation program
KUBOI NOBUYUKI0 citations40
SONY SEMICONDUCTOR SOLUTIONS CORP
8 patentsUS10361230B2Jul 23, 2019
Imaging element, method for manufacturing imaging element, pixel design method, and electronic apparatus with light collecting parts having plural projection and depression structures
SONY SEMICONDUCTOR SOLUTIONS CORP1 citations72
US12238947B2Feb 25, 2025
Solid-state imaging device, method of manufacturing solid-state imaging device, and electronic equipment
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations62
US11399752B2Aug 2, 2022
Enzyme sensor and electronic device
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations62
US10790125B2Sep 29, 2020
Damage prediction method and semiconductor processing system
SONY SEMICONDUCTOR SOLUTIONS CORP1 citations62
US10534355B2Jan 14, 2020
Information processing device, processing device, prediction method, and processing method
SONY SEMICONDUCTOR SOLUTIONS CORP1 citations62
US10403516B2Sep 3, 2019
Etching characteristic estimation method, program, information processing apparatus, processing apparatus, designing method, and production method
SONY SEMICONDUCTOR SOLUTIONS CORP1 citations62
US12557601B2Feb 17, 2026
Defect density calculation method, defect-density calculation program, defect-density calculation apparatus, heat treatment control system and machining control system
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations52
US9881107B2Jan 30, 2018
Simulation method, simulation program, processing apparatus, simulator, and design method
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations52