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Inventor
JASTRZEBSKI LUBEK
US
2 patents
Patents
2 patents
US5773989A
Jun 30, 1998
Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer
UNIV SOUTH FLORIDA
130 citations
95
US5663657A
Sep 2, 1997
Determining long minority carrier diffusion lengths
UNIV SOUTH FLORIDA
48 citations
88