P

Inventor

THOMAS LUC

US40 patents
⚠️ This page may combine multiple inventors who share the name “THOMAS LUC”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

19 patents
US10522746B1Dec 31, 2019

Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)

TAIWAN SEMICONDUCTOR MFG CO LTD16 citations94
US10797225B2Oct 6, 2020

Dual magnetic tunnel junction (DMTJ) stack design

TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US10475564B2Nov 12, 2019

Perpendicularly magnetized ferromagnetic layers having an oxide interface allowing for improved control of oxidation

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10431736B2Oct 1, 2019

Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anisotropy

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10658577B2May 19, 2020

Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anisotropy

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US12249450B2Mar 11, 2025

Perpendicularly magnetized ferromagnetic layers having an oxide interface allowing for improved control of oxidation

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12501836B2Dec 16, 2025

Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12356865B2Jul 8, 2025

Multilayer structure for reducing film roughness in magnetic devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12082509B2Sep 3, 2024

Dual magnetic tunnel junction (DMTJ) stack design

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11609296B2Mar 21, 2023

Method for measuring saturation magnetization of magnetic films and multilayer stacks

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11495738B2Nov 8, 2022

Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11397226B2Jul 26, 2022

Ferromagnetic resonance (FMR) electrical testing apparatus for spintronic devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11237240B2Feb 1, 2022

Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic films

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11092661B2Aug 17, 2021

Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayers

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10788561B2Sep 29, 2020

Method for measuring saturation magnetization of magnetic films and multilayer stacks

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US10754000B2Aug 25, 2020

Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic films

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11569441B2Jan 31, 2023

Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anistropy

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10401464B2Sep 3, 2019

Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayers

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10761154B2Sep 1, 2020

Ferromagnetic resonance (FMR) electrical testing apparatus for spintronic devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47

HEADWAY TECH INC

10 patents
US9466319B1Oct 11, 2016

Perpendicular magnetic recording (PMR) write shield design with minimized wide adjacent track erasure (WATE)

HEADWAY TECH INC87 citations98
US9425387B1Aug 23, 2016

Magnetic element with perpendicular magnetic anisotropy for high coercivity after high temperature annealing

HEADWAY TECH INC59 citations97
US10014465B1Jul 3, 2018

Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anisotropy

HEADWAY TECH INC22 citations94
US10115892B2Oct 30, 2018

Multilayer structure for reducing film roughness in magnetic devices

HEADWAY TECH INC2 citations73
US11264560B2Mar 1, 2022

Minimal thickness, low switching voltage magnetic free layers using an oxidation control layer and magnetic moment tuning layer for spintronic applications

HEADWAY TECH INC3 citations72
US10950782B2Mar 16, 2021

Nitride diffusion barrier structure for spintronic applications

HEADWAY TECH INC4 citations72
US12550623B2Feb 10, 2026

Nitride diffusion barrier structure for spintronic applications

HEADWAY TECH INC0 citations62
US11683994B2Jun 20, 2023

Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratio

HEADWAY TECH INC0 citations62
US11264566B2Mar 1, 2022

Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratio

HEADWAY TECH INC1 citations62
US11895928B2Feb 6, 2024

Integration scheme for three terminal spin-orbit-torque (SOT) switching devices

HEADWAY TECH INC0 citations52

IBM

8 patents

PARKIN STUART STEPHEN PAPWORTH

2 patents

CIT ALCATEL

1 patent