Inventor
THOMAS LUC
US40 patents
⚠️ This page may combine multiple inventors who share the name “THOMAS LUC”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
19 patentsUS10522746B1Dec 31, 2019
Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD16 citations94
US10797225B2Oct 6, 2020
Dual magnetic tunnel junction (DMTJ) stack design
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US10475564B2Nov 12, 2019
Perpendicularly magnetized ferromagnetic layers having an oxide interface allowing for improved control of oxidation
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10431736B2Oct 1, 2019
Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anisotropy
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10658577B2May 19, 2020
Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anisotropy
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US12249450B2Mar 11, 2025
Perpendicularly magnetized ferromagnetic layers having an oxide interface allowing for improved control of oxidation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12501836B2Dec 16, 2025
Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12356865B2Jul 8, 2025
Multilayer structure for reducing film roughness in magnetic devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12082509B2Sep 3, 2024
Dual magnetic tunnel junction (DMTJ) stack design
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11609296B2Mar 21, 2023
Method for measuring saturation magnetization of magnetic films and multilayer stacks
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11495738B2Nov 8, 2022
Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11397226B2Jul 26, 2022
Ferromagnetic resonance (FMR) electrical testing apparatus for spintronic devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11237240B2Feb 1, 2022
Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic films
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11092661B2Aug 17, 2021
Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayers
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10788561B2Sep 29, 2020
Method for measuring saturation magnetization of magnetic films and multilayer stacks
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US10754000B2Aug 25, 2020
Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic films
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11569441B2Jan 31, 2023
Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anistropy
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10401464B2Sep 3, 2019
Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayers
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10761154B2Sep 1, 2020
Ferromagnetic resonance (FMR) electrical testing apparatus for spintronic devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
HEADWAY TECH INC
10 patentsUS9466319B1Oct 11, 2016
Perpendicular magnetic recording (PMR) write shield design with minimized wide adjacent track erasure (WATE)
HEADWAY TECH INC87 citations98
US9425387B1Aug 23, 2016
Magnetic element with perpendicular magnetic anisotropy for high coercivity after high temperature annealing
HEADWAY TECH INC59 citations97
US10014465B1Jul 3, 2018
Maintaining coercive field after high temperature anneal for magnetic device applications with perpendicular magnetic anisotropy
HEADWAY TECH INC22 citations94
US10115892B2Oct 30, 2018
Multilayer structure for reducing film roughness in magnetic devices
HEADWAY TECH INC2 citations73
US11264560B2Mar 1, 2022
Minimal thickness, low switching voltage magnetic free layers using an oxidation control layer and magnetic moment tuning layer for spintronic applications
HEADWAY TECH INC3 citations72
US10950782B2Mar 16, 2021
Nitride diffusion barrier structure for spintronic applications
HEADWAY TECH INC4 citations72
US12550623B2Feb 10, 2026
Nitride diffusion barrier structure for spintronic applications
HEADWAY TECH INC0 citations62
US11683994B2Jun 20, 2023
Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratio
HEADWAY TECH INC0 citations62
US11264566B2Mar 1, 2022
Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratio
HEADWAY TECH INC1 citations62
US11895928B2Feb 6, 2024
Integration scheme for three terminal spin-orbit-torque (SOT) switching devices
HEADWAY TECH INC0 citations52
IBM
8 patentsUS6166948ADec 26, 2000
Magnetic memory array with magnetic tunnel junction memory cells having flux-closed free layers
IBM386 citations99
US7667994B1Feb 23, 2010
Magnetic racetrack with current-controlled motion of domain walls within an undulating energy landscape
IBM18 citations90
US7626844B1Dec 1, 2009
Magnetic racetrack with current-controlled motion of domain walls within an undulating energy landscape
IBM35 citations90
US7760535B2Jul 20, 2010
Sequence of current pulses for depinning magnetic domain walls
IBM9 citations83
US7492622B2Feb 17, 2009
Sequence of current pulses for depinning magnetic domain walls
IBM11 citations83
US8934289B2Jan 13, 2015
Multiple bit nonvolatile memory based on current induced domain wall motion in a nanowire magnetic tunnel junction
IBM4 citations73
US8923039B2Dec 30, 2014
Multiple bit nonvolatile memory based on current induced domain wall motion in a nanowire magnetic tunnel junction
IBM4 citations73
US8767432B1Jul 1, 2014
Method and apparatus for controlled application of Oersted field to magnetic memory structure
IBM0 citations42
PARKIN STUART STEPHEN PAPWORTH
2 patentsUS8687415B2Apr 1, 2014
Domain wall motion in perpendicularly magnetized wires having artificial antiferromagnetically coupled multilayers with engineered interfaces
PARKIN STUART STEPHEN PAPWORTH37 citations91
US8638601B1Jan 28, 2014
Domain wall motion in perpendicularly magnetized wires having magnetic multilayers with engineered interfaces
PARKIN STUART STEPHEN PAPWORTH2 citations60