Inventor

WANG YIBING MICHELLE

US123 patents

⚠️ This page may combine multiple inventors who share the name “WANG YIBING MICHELLE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WANG YIBING MICHELLE

SAMSUNG ELECTRONICS CO LTD

CMOS image sensor for 2D imaging and depth measurement with ambient light rejection

Time-resolving sensor using shared PPD + SPAD pixel and spatial-temporal correlation for range measurement

Increasing tolerance of sensor-scanner misalignment of the 3D camera with epipolar line laser point scanning

CMOS image sensor for depth measurement using triangulation with point scan

Time-of-flight (TOF) image sensor using amplitude modulation for range measurement

Multi-camera on a chip and camera module design

Time-resolving sensor using SPAD + PPD or capacitors in pixel for range measurement

CMOS image sensor for RGB imaging and depth measurement with laser sheet scan

CMOS image sensor for RGB imaging and depth measurement with laser sheet scan

Apparatus for and method of range sensor based on direct time-of-flight and triangulation

CMOS image sensor for 2D imaging and depth measurement with ambient light rejection

CMOS image sensor for 2D imaging and depth measurement with ambient light rejection

Time-resolving sensor using SPAD + PPD or capacitors in pixel for range measurement

CMOS image sensor for 2D imaging and depth measurement with ambient light rejection

Time-resolving sensor using SPAD + PPD or capacitors in pixel for range measurement

Time-resolving sensor using shared PPD+SPAD pixel and spatial-temporal correlation for range measurement

Timestamp calibration of the 3D camera with epipolar line laser point scanning

Epipolar plane single-pulse indirect TOF imaging for automotives

Method and apparatus of image representation and processing for dynamic vision sensor

Unit pixel of stacked image sensor and stacked image sensor including the same

Performing spatial and temporal image contrast detection in pixel array

Biometric camera

Timestamp calibration of the 3D camera with epipolar line laser point scanning

Object recognition with reduced neural network weight precision

Time-resolving computational image sensor architecture for time-of-flight, high-dynamic-range, and high-speed imaging

CMOS image sensor for RGB imaging and depth measurement with laser sheet scan

Time-resolving sensor using SPAD + PPD or capacitors in pixel for range measurement

Progressive metalens for sensing system

Object recognition with reduced neural network weight precision

Apparatus for and method of range sensor based on direct time-of-flight and triangulation

LWIR sensor with capacitive microbolometer and hybrid visible/LWIR sensor

Three-dimensional camera system

Time-resolving image sensor for range measurement and 2D greyscale imaging

Timestamp calibration of the 3D camera with epipolar line laser point scanning

MICRON TECHNOLOGY INC

Dynamic histogram equalization for high dynamic range images

Apparatus and method for eliminating artifacts in active pixel sensor (APS) imagers

Image sensing system with histogram modification

Dual sensitivity image sensor

Image sensing system with histogram modification

Image sensing system with histogram modification

WANG YIBING MICHELLE

CMOS image sensor for 2D imaging and depth measurement with ambient light rejection

Frame-wise calibration of column-parallel ADCs for image sensor array applications

Continuous ramp generator design and its calibration for CMOS image sensors using single-ramp ADCs

Automatic offset adjustment for digital calibration of column parallel single-slope ADCs for image sensors

Apparatus and method for eliminating artifacts in active pixel sensor (APS) imagers

JI ZHENGPING

Object recognition with reduced neural network weight precision

Method and apparatus for event sampling of dynamic vision sensor on image formation

ZHANG QIANG

Method and apparatus of neural network based image signal processor

RYSINSKI JEFF

Image processing system with on-chip test mode for column ADCs

LEE SANG-SOO

Differential column ADC architectures for CMOS image sensor applications