Inventor
DE BOKX PIETER K
NL5 patents
Patents
5 patentsUS5745543AApr 28, 1998
Apparatus for simultaneous X-ray diffraction and X-ray fluorescence measurements
PHILIPS CORP64 citations93
US5831184ANov 3, 1998
Sample holder for a sample to be subjected to radiation analysis
PHILIPS CORP32 citations91
US5684857ANov 4, 1997
Method for GE-XRF X-ray analysis of materials, and apparatus for carrying out the method
PHILIPS CORP37 citations90
US5757883AMay 26, 1998
Method of manufacturing an X-ray optical element for an X-ray analysis apparatus
PHILIPS CORP14 citations71
US6263042B1Jul 17, 2001
Apparatus for X-ray analysis in grazing exit conditions
PHILIPS CORP9 citations68