Inventor

SHIRAISHI DAISUKE

JP68 patents

⚠️ This page may combine multiple inventors who share the name “SHIRAISHI DAISUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHIRAISHI DAISUKE

HITACHI HIGH TECH CORP

Data analysis method for plasma processing apparatus, plasma processing method and plasma processing apparatus

Particle control device and particle control method for vacuum processing apparatus

Plasma processing apparatus and method

Analysis method and semiconductor etching apparatus

Plasma processing apparatus and data analysis apparatus

Analysis method and semiconductor etching apparatus

Plasma processing apparatus and analyzing apparatus

Data analysis method for plasma processing apparatus, plasma processing method and plasma processing apparatus

Analysis method, analysis device, and etching processing system

Etching apparatus, method for measuring self-bias voltage, and method for monitoring etching apparatus

Method and apparatus for processing semiconductor

Plasma processing apparatus, plasma processing method and plasma processing analysis method

Plasma processing apparatus

Plasma processing apparatus and data analysis apparatus

Plasma processing apparatus and analysis method for analyzing plasma processing data

Plasma processing apparatus and analysis method for analyzing plasma processing data

Etching system and etching method

Plasma processing apparatus and plasma processing system

Plasma processing apparatus

Plasma processing apparatus and plasma processing system

Plasma processing apparatus, data analysis apparatus, and semiconductor device manufacturing system

CANON KK

Bus arbitration apparatus and method

Lens barrel

Memory control apparatus and memory control method

Communication apparatus

Memory controller, control method for memory controller, and storage medium

Memory controller and memory control method that decides an order of issuing dram commands based on whether a command has a penalty period

Memory control circuit, information processing system, and memory control method

DRAM access technique to reduce latency due to write command length

Lens apparatus, image pickup apparatus, and camera system

HITACHI LTD

Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system therefor

Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system therefor

Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a therefor

System for monitoring and controlling a semiconductor manufacturing apparatus using prediction model equation

Semiconductor plasma processing apparatus with first and second processing state monitoring units

MORISAWA TOSHIHIRO

Semiconductor manufacturing equipment

Etching apparatus, control simulator, and semiconductor device manufacturing method

Etching apparatus, analysis apparatus, etching treatment method, and etching treatment program

Etching process state judgment method and system therefor

KAGOSHIMA AKIRA

Plasma processing apparatus

Plasma processing apparatus and plasma processing method

SHIRAISHI DAISUKE

Communication apparatus, control method for communication apparatus, and computer program

Transmission apparatus that transmits data according to a protocol, and method for measuring time in the transmission apparatus

KANEKO SHUHEI

Digital camera

OLYMPUS IMAGING CORP

Cam follower for lens barrel and lens barrel

OLYMPUS CORP

Lens barrel and lens barrel system

SK HYNIX INC

Image signal processor and imaging system including the same

MINAMI TOSHIAKI

Bus arbitration apparatus and method

UCHIDA HIROSHIGE

Etching endpoint determination method

TOYOTA MOTOR CO LTD

Driving support device