Inventor
PELZER GEORG
DE2 patents
Patents
2 patentsUS9500602B2Nov 22, 2016
Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning
SIEMENS AG0 citations34
US9498171B2Nov 22, 2016
Method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement
SIEMENS AG0 citations34