Inventor

KRENZ-BAATH RENE

DE3 patents

⚠️ This page may combine multiple inventors who share the name “KRENZ-BAATH RENE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HAPKE FRIEDRICH

1 patent

US8423845B2Apr 16, 2013

On-chip logic to log failures during production testing and enable debugging for failure diagnosis

HAPKE FRIEDRICH3 citations57

KRENZ-BAATH RENE

1 patent

US8689069B2Apr 1, 2014

Multi-targeting boolean satisfiability-based test pattern generation

KRENZ-BAATH RENE3 citations52

HOCHSCHULE HAMM LIPPSTADT

1 patent

US11237211B2Feb 1, 2022

Microchip having a plurality of reconfigurable test structures

HOCHSCHULE HAMM LIPPSTADT0 citations38