Inventor
SKORDAS SPYRIDON
US51 patents
⚠️ This page may combine multiple inventors who share the name “SKORDAS SPYRIDON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
43 patentsUS10681207B1Jun 9, 2020
Caller identity verification based on unique multi-device signatures
IBM35 citations94
US9064937B2Jun 23, 2015
Substrate bonding with diffusion barrier structures
IBM29 citations94
US8900885B1Dec 2, 2014
Wafer bonding misalignment reduction
IBM22 citations91
US9263366B2Feb 16, 2016
Liquid cooling of semiconductor chips utilizing small scale structures
IBM8 citations84
US9059039B2Jun 16, 2015
Reducing wafer bonding misalignment by varying thermal treatment prior to bonding
IBM6 citations84
US9028628B2May 12, 2015
Wafer-to-wafer oxide fusion bonding
IBM12 citations84
US10157757B2Dec 18, 2018
Gas-controlled bonding platform for edge defect reduction during wafer bonding
IBM4 citations83
US9922851B2Mar 20, 2018
Gas-controlled bonding platform for edge defect reduction during wafer bonding
IBM8 citations83
US10269760B2Apr 23, 2019
Advanced chip to wafer stacking
IBM2 citations73
US10170447B2Jan 1, 2019
Advanced chip to wafer stacking
IBM1 citations73
US9671215B2Jun 6, 2017
Wafer to wafer alignment
IBM5 citations73
US9536853B2Jan 3, 2017
Semiconductor device including built-in crack-arresting film structure
IBM3 citations73
US9472710B1Oct 18, 2016
Low-loss large-grain optical waveguide for interconnecting components integrated on a glass substrate
IBM5 citations73
US9058974B2Jun 16, 2015
Distorting donor wafer to corresponding distortion of host wafer
IBM4 citations73
US10915620B2Feb 9, 2021
Paint on micro chip touch screens
IBM1 citations72
US10404306B2Sep 3, 2019
Paint on micro chip touch screens
IBM1 citations72
US10056272B2Aug 21, 2018
Gas-controlled bonding platform for edge defect reduction during wafer bonding
IBM3 citations72
US9543229B2Jan 10, 2017
Combination of TSV and back side wiring in 3D integration
IBM2 citations72
US9536809B2Jan 3, 2017
Combination of TSV and back side wiring in 3D integration
IBM3 citations72
US9881896B2Jan 30, 2018
Advanced chip to wafer stacking
IBM1 citations63
US9105517B2Aug 11, 2015
Wafer to wafer alignment by LED/LSD devices
IBM2 citations63
US7909208B2Mar 22, 2011
Process of monitoring dispensing of process fluids in precision processing operations
IBM3 citations63
US11239167B2Feb 1, 2022
Cu—Cu bonding for interconnects on bridge chip attached to chips and packaging substrate
IBM0 citations62
US11790072B2Oct 17, 2023
Paint on micro chip touch screens
IBM0 citations61
US11355379B1Jun 7, 2022
Oxide-bonded wafer pair separation using laser debonding
IBM0 citations61
US12469787B2Nov 11, 2025
Resist patterned redistribution wiring on copper polyimide via layer
IBM0 citations60
US11068896B2Jul 20, 2021
Granting requests for authorization using data of devices associated with requestors
IBM0 citations52
US10615139B2Apr 7, 2020
Semiconductor device including built-in crack-arresting film structure
IBM0 citations52
US10211178B2Feb 19, 2019
Semiconductor device including built-in crack-arresting film structure
IBM0 citations52
US10134577B2Nov 20, 2018
Edge trim processes and resultant structures
IBM0 citations52
US10020279B2Jul 10, 2018
Semiconductor device including built-in crack-arresting film structure
IBM0 citations52
US9784917B2Oct 10, 2017
Low-loss large-grain optical waveguide for interconnecting components integrated on a glass substrate
IBM1 citations52
US9564386B2Feb 7, 2017
Semiconductor package with structures for cooling fluid retention
IBM0 citations52
US9472457B2Oct 18, 2016
Manganese oxide hard mask for etching dielectric materials
IBM0 citations52
US9190303B2Nov 17, 2015
Reducing wafer bonding misalignment by varying thermal treatment prior to bonding
IBM0 citations52
US9142488B2Sep 22, 2015
Manganese oxide hard mask for etching dielectric materials
IBM0 citations52
US9059333B1Jun 16, 2015
Facilitating chip dicing for metal-metal bonding and hybrid wafer bonding
IBM1 citations52
US10777433B2Sep 15, 2020
Gas-controlled bonding platform for edge defect reduction during wafer bonding
IBM0 citations51
US11182722B2Nov 23, 2021
Cognitive system for automatic risk assessment, solution identification, and action enablement
IBM0 citations50
US9378966B2Jun 28, 2016
Selective etching of silicon wafer
IBM1 citations48
US11322361B2May 3, 2022
Selective etching of silicon wafer
IBM0 citations45
US9553054B2Jan 24, 2017
Strain detection structures for bonded wafers and chips
IBM0 citations42
US9171749B2Oct 27, 2015
Handler wafer removal facilitated by the addition of an amorphous carbon layer on the handler wafer
IBM0 citations42
GLOBALFOUNDRIES INC
4 patentsUS9620481B2Apr 11, 2017
Substrate bonding with diffusion barrier structures
GLOBALFOUNDRIES INC220 citations99
US9466538B1Oct 11, 2016
Method to achieve ultra-high chip-to-chip alignment accuracy for wafer-to-wafer bonding process
GLOBALFOUNDRIES INC43 citations94
US9401303B2Jul 26, 2016
Handler wafer removal by use of sacrificial inert layer
GLOBALFOUNDRIES INC4 citations72
US9640514B1May 2, 2017
Wafer bonding using boron and nitrogen based bonding stack
GLOBALFOUNDRIES INC2 citations71
FAROOQ MUKTA G
2 patentsLA TULIPE JR DOUGLAS C
1 patentShowing the top 50 of 51 patents by PatentIndex Score.