P

Inventor

SKORDAS SPYRIDON

US51 patents
⚠️ This page may combine multiple inventors who share the name “SKORDAS SPYRIDON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

43 patents
US10681207B1Jun 9, 2020

Caller identity verification based on unique multi-device signatures

IBM35 citations94
US9064937B2Jun 23, 2015

Substrate bonding with diffusion barrier structures

IBM29 citations94
US8900885B1Dec 2, 2014

Wafer bonding misalignment reduction

IBM22 citations91
US9263366B2Feb 16, 2016

Liquid cooling of semiconductor chips utilizing small scale structures

IBM8 citations84
US9059039B2Jun 16, 2015

Reducing wafer bonding misalignment by varying thermal treatment prior to bonding

IBM6 citations84
US9028628B2May 12, 2015

Wafer-to-wafer oxide fusion bonding

IBM12 citations84
US10157757B2Dec 18, 2018

Gas-controlled bonding platform for edge defect reduction during wafer bonding

IBM4 citations83
US9922851B2Mar 20, 2018

Gas-controlled bonding platform for edge defect reduction during wafer bonding

IBM8 citations83
US10269760B2Apr 23, 2019

Advanced chip to wafer stacking

IBM2 citations73
US10170447B2Jan 1, 2019

Advanced chip to wafer stacking

IBM1 citations73
US9671215B2Jun 6, 2017

Wafer to wafer alignment

IBM5 citations73
US9536853B2Jan 3, 2017

Semiconductor device including built-in crack-arresting film structure

IBM3 citations73
US9472710B1Oct 18, 2016

Low-loss large-grain optical waveguide for interconnecting components integrated on a glass substrate

IBM5 citations73
US9058974B2Jun 16, 2015

Distorting donor wafer to corresponding distortion of host wafer

IBM4 citations73
US10915620B2Feb 9, 2021

Paint on micro chip touch screens

IBM1 citations72
US10404306B2Sep 3, 2019

Paint on micro chip touch screens

IBM1 citations72
US10056272B2Aug 21, 2018

Gas-controlled bonding platform for edge defect reduction during wafer bonding

IBM3 citations72
US9543229B2Jan 10, 2017

Combination of TSV and back side wiring in 3D integration

IBM2 citations72
US9536809B2Jan 3, 2017

Combination of TSV and back side wiring in 3D integration

IBM3 citations72
US9881896B2Jan 30, 2018

Advanced chip to wafer stacking

IBM1 citations63
US9105517B2Aug 11, 2015

Wafer to wafer alignment by LED/LSD devices

IBM2 citations63
US7909208B2Mar 22, 2011

Process of monitoring dispensing of process fluids in precision processing operations

IBM3 citations63
US11239167B2Feb 1, 2022

Cu—Cu bonding for interconnects on bridge chip attached to chips and packaging substrate

IBM0 citations62
US11790072B2Oct 17, 2023

Paint on micro chip touch screens

IBM0 citations61
US11355379B1Jun 7, 2022

Oxide-bonded wafer pair separation using laser debonding

IBM0 citations61
US12469787B2Nov 11, 2025

Resist patterned redistribution wiring on copper polyimide via layer

IBM0 citations60
US11068896B2Jul 20, 2021

Granting requests for authorization using data of devices associated with requestors

IBM0 citations52
US10615139B2Apr 7, 2020

Semiconductor device including built-in crack-arresting film structure

IBM0 citations52
US10211178B2Feb 19, 2019

Semiconductor device including built-in crack-arresting film structure

IBM0 citations52
US10134577B2Nov 20, 2018

Edge trim processes and resultant structures

IBM0 citations52
US10020279B2Jul 10, 2018

Semiconductor device including built-in crack-arresting film structure

IBM0 citations52
US9784917B2Oct 10, 2017

Low-loss large-grain optical waveguide for interconnecting components integrated on a glass substrate

IBM1 citations52
US9564386B2Feb 7, 2017

Semiconductor package with structures for cooling fluid retention

IBM0 citations52
US9472457B2Oct 18, 2016

Manganese oxide hard mask for etching dielectric materials

IBM0 citations52
US9190303B2Nov 17, 2015

Reducing wafer bonding misalignment by varying thermal treatment prior to bonding

IBM0 citations52
US9142488B2Sep 22, 2015

Manganese oxide hard mask for etching dielectric materials

IBM0 citations52
US9059333B1Jun 16, 2015

Facilitating chip dicing for metal-metal bonding and hybrid wafer bonding

IBM1 citations52
US10777433B2Sep 15, 2020

Gas-controlled bonding platform for edge defect reduction during wafer bonding

IBM0 citations51
US11182722B2Nov 23, 2021

Cognitive system for automatic risk assessment, solution identification, and action enablement

IBM0 citations50
US9378966B2Jun 28, 2016

Selective etching of silicon wafer

IBM1 citations48
US11322361B2May 3, 2022

Selective etching of silicon wafer

IBM0 citations45
US9553054B2Jan 24, 2017

Strain detection structures for bonded wafers and chips

IBM0 citations42
US9171749B2Oct 27, 2015

Handler wafer removal facilitated by the addition of an amorphous carbon layer on the handler wafer

IBM0 citations42

GLOBALFOUNDRIES INC

4 patents

FAROOQ MUKTA G

2 patents

LA TULIPE JR DOUGLAS C

1 patent

Showing the top 50 of 51 patents by PatentIndex Score.