Inventor
FAN SU CHEN
US124 patents
⚠️ This page may combine multiple inventors who share the name “FAN SU CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
34 patentsUS9397049B1Jul 19, 2016
Gate tie-down enablement with inner spacer
IBM25 citations98
US10020381B1Jul 10, 2018
Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors
IBM17 citations94
US10971490B2Apr 6, 2021
Three-dimensional field effect device
IBM6 citations84
US9960078B1May 1, 2018
Reflow interconnect using Ru
IBM4 citations84
US9735054B2Aug 15, 2017
Gate tie-down enablement with inner spacer
IBM4 citations84
US9728462B2Aug 8, 2017
Stable multiple threshold voltage devices on replacement metal gate CMOS devices
IBM12 citations84
US9583442B2Feb 28, 2017
Interconnect structure including middle of line (MOL) metal layer local interconnect on etch stop layer
IBM5 citations84
US9576901B1Feb 21, 2017
Contact area structure and method for manufacturing the same
IBM12 citations84
US9570397B1Feb 14, 2017
Local interconnect structure including non-eroded contact via trenches
IBM7 citations84
US9293551B2Mar 22, 2016
Integrated multiple gate length semiconductor device including self-aligned contacts
IBM12 citations84
US8383490B2Feb 26, 2013
Borderless contact for ultra-thin body devices
IBM15 citations84
US11171051B1Nov 9, 2021
Contacts and liners having multi-segmented protective caps
IBM9 citations83
US11810828B2Nov 7, 2023
Transistor boundary protection using reversible crosslinking reflow
IBM2 citations73
US11489111B2Nov 1, 2022
Reversible resistive memory logic gate device
IBM2 citations73
US11222981B2Jan 11, 2022
Three-dimensional field effect device
IBM1 citations73
US11205590B2Dec 21, 2021
Self-aligned contacts for MOL
IBM2 citations73
US11164778B2Nov 2, 2021
Barrier-free vertical interconnect structure
IBM3 citations73
US11158543B2Oct 26, 2021
Silicide formation for source/drain contact in a vertical transport field-effect transistor
IBM2 citations73
US10943990B2Mar 9, 2021
Gate contact over active enabled by alternative spacer scheme and claw-shaped cap
IBM5 citations73
US10879375B2Dec 29, 2020
Gate tie-down enablement with inner spacer
IBM1 citations73
US10832943B2Nov 10, 2020
Gate contact over active region with self-aligned source/drain contact
IBM4 citations73
US10727317B2Jul 28, 2020
Bottom contact formation for vertical transistor devices
IBM4 citations73
US10615027B1Apr 7, 2020
Stack viabar structures
IBM2 citations73
US10490667B1Nov 26, 2019
Three-dimensional field effect device
IBM2 citations73
US10490653B2Nov 26, 2019
Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors
IBM1 citations73
US10319835B2Jun 11, 2019
Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors
IBM1 citations73
US10186599B1Jan 22, 2019
Forming self-aligned contact with spacer first
IBM2 citations73
US9985027B2May 29, 2018
Stable multiple threshold voltage devices on replacement metal gate CMOS devices
IBM2 citations73
US9786607B2Oct 10, 2017
Interconnect structure including middle of line (MOL) metal layer local interconnect on ETCH stop layer
IBM2 citations73
US9385123B2Jul 5, 2016
STI region for small fin pitch in FinFET devices
IBM6 citations73
US9653571B2May 16, 2017
Freestanding spacer having sub-lithographic lateral dimension and method of forming same
IBM2 citations72
US11114382B2Sep 7, 2021
Middle-of-line interconnect having low metal-to-metal interface resistance
IBM4 citations68
US12543554B2Feb 3, 2026
Stacked field effect transistor contacts
IBM0 citations63
US12446320B2Oct 14, 2025
Bottom contact with self-aligned spacer for stacked semiconductor devices
IBM0 citations63
GLOBALFOUNDRIES INC
6 patentsUS9257348B2Feb 9, 2016
Methods of forming replacement gate structures for transistors and the resulting devices
GLOBALFOUNDRIES INC43 citations94
US9570573B1Feb 14, 2017
Self-aligned gate tie-down contacts with selective etch stop liner
GLOBALFOUNDRIES INC15 citations84
US9455254B2Sep 27, 2016
Methods of forming a combined gate and source/drain contact structure and the resulting device
GLOBALFOUNDRIES INC10 citations84
US9287130B1Mar 15, 2016
Method for single fin cuts using selective ion implants
GLOBALFOUNDRIES INC12 citations83
US10497798B2Dec 3, 2019
Vertical field effect transistor with self-aligned contacts
GLOBALFOUNDRIES INC2 citations73
US10312154B2Jun 4, 2019
Method of forming vertical FinFET device having self-aligned contacts
GLOBALFOUNDRIES INC4 citations73
TAIWAN SEMICONDUCTOR MFG
4 patentsUS7371663B2May 13, 2008
Three dimensional IC device and alignment methods of IC device substrates
TAIWAN SEMICONDUCTOR MFG22 citations93
US7781892B2Aug 24, 2010
Interconnect structure and method of fabricating same
TAIWAN SEMICONDUCTOR MFG12 citations81
US6254739B1Jul 3, 2001
Pre-treatment for salicide process
TAIWAN SEMICONDUCTOR MFG10 citations74
US7301239B2Nov 27, 2007
Wiring structure to minimize stress induced void formation
TAIWAN SEMICONDUCTOR MFG7 citations70
XIE RUILONG
3 patentsUS8772168B2Jul 8, 2014
Formation of the dielectric cap layer for a replacement gate structure
XIE RUILONG34 citations93
US8679968B2Mar 25, 2014
Method for forming a self-aligned contact opening by a lateral etch
XIE RUILONG19 citations90
US8679909B2Mar 25, 2014
Recessing and capping of gate structures with varying metal compositions
XIE RUILONG14 citations82
HORAK DAVID V
1 patentKOBURGER III CHARLES W
1 patentGLOBALFOUNFRIES SINGAPORE PTE LTD
1 patentShowing the top 50 of 124 patents by PatentIndex Score.