P

Inventor

FAN SU CHEN

US124 patents
⚠️ This page may combine multiple inventors who share the name “FAN SU CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

34 patents
US9397049B1Jul 19, 2016

Gate tie-down enablement with inner spacer

IBM25 citations98
US10020381B1Jul 10, 2018

Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors

IBM17 citations94
US10971490B2Apr 6, 2021

Three-dimensional field effect device

IBM6 citations84
US9960078B1May 1, 2018

Reflow interconnect using Ru

IBM4 citations84
US9735054B2Aug 15, 2017

Gate tie-down enablement with inner spacer

IBM4 citations84
US9728462B2Aug 8, 2017

Stable multiple threshold voltage devices on replacement metal gate CMOS devices

IBM12 citations84
US9583442B2Feb 28, 2017

Interconnect structure including middle of line (MOL) metal layer local interconnect on etch stop layer

IBM5 citations84
US9576901B1Feb 21, 2017

Contact area structure and method for manufacturing the same

IBM12 citations84
US9570397B1Feb 14, 2017

Local interconnect structure including non-eroded contact via trenches

IBM7 citations84
US9293551B2Mar 22, 2016

Integrated multiple gate length semiconductor device including self-aligned contacts

IBM12 citations84
US8383490B2Feb 26, 2013

Borderless contact for ultra-thin body devices

IBM15 citations84
US11171051B1Nov 9, 2021

Contacts and liners having multi-segmented protective caps

IBM9 citations83
US11810828B2Nov 7, 2023

Transistor boundary protection using reversible crosslinking reflow

IBM2 citations73
US11489111B2Nov 1, 2022

Reversible resistive memory logic gate device

IBM2 citations73
US11222981B2Jan 11, 2022

Three-dimensional field effect device

IBM1 citations73
US11205590B2Dec 21, 2021

Self-aligned contacts for MOL

IBM2 citations73
US11164778B2Nov 2, 2021

Barrier-free vertical interconnect structure

IBM3 citations73
US11158543B2Oct 26, 2021

Silicide formation for source/drain contact in a vertical transport field-effect transistor

IBM2 citations73
US10943990B2Mar 9, 2021

Gate contact over active enabled by alternative spacer scheme and claw-shaped cap

IBM5 citations73
US10879375B2Dec 29, 2020

Gate tie-down enablement with inner spacer

IBM1 citations73
US10832943B2Nov 10, 2020

Gate contact over active region with self-aligned source/drain contact

IBM4 citations73
US10727317B2Jul 28, 2020

Bottom contact formation for vertical transistor devices

IBM4 citations73
US10615027B1Apr 7, 2020

Stack viabar structures

IBM2 citations73
US10490667B1Nov 26, 2019

Three-dimensional field effect device

IBM2 citations73
US10490653B2Nov 26, 2019

Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors

IBM1 citations73
US10319835B2Jun 11, 2019

Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors

IBM1 citations73
US10186599B1Jan 22, 2019

Forming self-aligned contact with spacer first

IBM2 citations73
US9985027B2May 29, 2018

Stable multiple threshold voltage devices on replacement metal gate CMOS devices

IBM2 citations73
US9786607B2Oct 10, 2017

Interconnect structure including middle of line (MOL) metal layer local interconnect on ETCH stop layer

IBM2 citations73
US9385123B2Jul 5, 2016

STI region for small fin pitch in FinFET devices

IBM6 citations73
US9653571B2May 16, 2017

Freestanding spacer having sub-lithographic lateral dimension and method of forming same

IBM2 citations72
US11114382B2Sep 7, 2021

Middle-of-line interconnect having low metal-to-metal interface resistance

IBM4 citations68
US12543554B2Feb 3, 2026

Stacked field effect transistor contacts

IBM0 citations63
US12446320B2Oct 14, 2025

Bottom contact with self-aligned spacer for stacked semiconductor devices

IBM0 citations63

GLOBALFOUNDRIES INC

6 patents

TAIWAN SEMICONDUCTOR MFG

4 patents

XIE RUILONG

3 patents

HORAK DAVID V

1 patent

KOBURGER III CHARLES W

1 patent

GLOBALFOUNFRIES SINGAPORE PTE LTD

1 patent

Showing the top 50 of 124 patents by PatentIndex Score.