Inventor
NAKAMICHI MASARU
JP20 patents
⚠️ This page may combine multiple inventors who share the name “NAKAMICHI MASARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RENESAS ELECTRONICS CORP
5 patentsUS7964484B2Jun 21, 2011
Semiconductor integrated circuit device with reduced leakage current
RENESAS ELECTRONICS CORP14 citations92
US7863135B2Jan 4, 2011
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device
RENESAS ELECTRONICS CORP21 citations92
US8797791B2Aug 5, 2014
Semiconductor integrated circuit device with reduced leakage current
RENESAS ELECTRONICS CORP7 citations84
US9530485B2Dec 27, 2016
Semiconductor integrated circuit device with reduced leakage current
RENESAS ELECTRONICS CORP1 citations63
US9111636B2Aug 18, 2015
Semiconductor integrated circuit device with reduced leakage current
RENESAS ELECTRONICS CORP2 citations63
RENESAS TECH CORP
4 patentsUS7371631B2May 13, 2008
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device
RENESAS TECH CORP42 citations96
US7663176B2Feb 16, 2010
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device
RENESAS TECH CORP28 citations92
US7569881B2Aug 4, 2009
Semiconductor integrated circuit device with reduced leakage current
RENESAS TECH CORP9 citations92
US7388238B2Jun 17, 2008
Semiconductor integrated circuit device with reduced leakage current
RENESAS TECH CORP6 citations74
HITACHI ULSI SYS CO LTD
4 patentsUS6998674B2Feb 14, 2006
Semiconductor integrated circuit device with reduced leakage current
HITACHI ULSI SYS CO LTD28 citations96
US6885057B2Apr 26, 2005
Semiconductor integrated circuit device with reduced leakage current
HITACHI ULSI SYS CO LTD12 citations92
US7087942B2Aug 8, 2006
Semiconductor integrated circuit device with reduced leakage current
HITACHI ULSI SYS CO LTD9 citations82
US7045864B2May 16, 2006
Semiconductor integrated circuit device
HITACHI ULSI SYS CO LTD6 citations63
OSADA KENICHI
3 patentsUS8437179B2May 7, 2013
Semiconductor integrated circuit device with reduced leakage current
OSADA KENICHI3 citations73
US8232589B2Jul 31, 2012
Semiconductor integrated circuit device with reduced leakage current
OSADA KENICHI1 citations62
US8125017B2Feb 28, 2012
Semiconductor integrated circuit device with reduced leakage current
OSADA KENICHI1 citations62
NATIONAL INSTITUTES FOR QUANTUM SCIENCE AND TECH
2 patentsUS12473205B2Nov 18, 2025
Beryllium solution production method, beryllium production method, beryllium hydroxide production method, beryllium oxide production method, solution production device, beryllium production system, and beryllium
NATIONAL INSTITUTES FOR QUANTUM SCIENCE AND TECH1 citations60
US12467115B2Nov 11, 2025
Method for producing beryllium solution, method for producing beryllium, method for producing beryllium hydroxide, method for producing beryllium oxide, and beryllium oxide
NATIONAL INSTITUTES FOR QUANTUM SCIENCE AND TECH0 citations57