Inventor
LYSINGER MARK ALAN
US4 patents
Patents
4 patentsUS5896040AApr 20, 1999
Configurable probe pads to facilitate parallel testing of integrated circuit devices
ST MICROELECTRONICS INC24 citations89
US7230839B2Jun 12, 2007
Magnitude content addressable memory
ST MICROELECTRONICS INC10 citations80
US5982188ANov 9, 1999
Test mode control circuit of an integrated circuit device
ST MICROELECTRONICS INC15 citations70
US5896039AApr 20, 1999
Configurable probe pads to facilitate parallel testing of integrated circuit devices
ST MICROELECTRONICS INC14 citations70