Inventor

BATIKOFF AMIT

IL19 patents

⚠️ This page may combine multiple inventors who share the name “BATIKOFF AMIT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BATIKOFF AMIT

APPLIED MATERIALS ISRAEL LTD

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of inspecting a specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of inspecting a specimen and system thereof

Method of inspecting a specimen and system thereof

Method of inspecting a specimen and system thereof

Method of performing metrology operations and system thereof

Method of inspecting a specimen and system thereof

Registration between an image of an object and a description

Method of performing metrology operations and system thereof

Method of performing metrology operations and system thereof

Method of detecting defects in an object

GM GLOBAL TECH OPERATIONS LLC

Alignment validation in vehicle-based sensors

Methods and systems for controlling automated driving features of a vehicle

Rendering-based lidar and camera alignment

DALLA-TORRE MICHELE

System, method and computer program product for classification within inspection images

System, method and computer program product for detection of defects within inspection images