Inventor
COHEN SHAUL
IL10 patents
Patents
10 patentsUS11022566B1Jun 1, 2021
Examination of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD13 citations82
US11232550B2Jan 25, 2022
Generating a training set usable for examination of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD2 citations65
US10120973B2Nov 6, 2018
Method of performing metrology operations and system thereof
APPLIED MATERIALS ISRAEL LTD0 citations48
US11854184B2Dec 26, 2023
Determination of defects and/or edge roughness in a specimen based on a reference image
APPLIED MATERIALS ISRAEL LTD0 citations47
US10902620B1Jan 26, 2021
Registration between an image of an object and a description
APPLIED MATERIALS ISRAEL LTD0 citations47
US10571406B2Feb 25, 2020
Method of performing metrology operations and system thereof
APPLIED MATERIALS ISRAEL LTD0 citations46
US11631179B2Apr 18, 2023
Segmentation of an image of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations44
US12260543B2Mar 25, 2025
Machine learning based examination of a semiconductor specimen and training thereof
APPLIED MATERIALS ISRAEL LTD0 citations43
US10504693B2Dec 10, 2019
Evaluating an object
APPLIED MATERIALS ISRAEL LTD0 citations43
US10296702B2May 21, 2019
Method of performing metrology operations and system thereof
APPLIED MATERIALS ISRAEL LTD0 citations37