Inventor
SONG KI JAE
KR18 patents
⚠️ This page may combine multiple inventors who share the name “SONG KI JAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
13 patentsUS8023349B2Sep 20, 2011
Memory system, memory test system and method of testing memory system and memory test system
SAMSUNG ELECTRONICS CO LTD9 citations82
US10732219B2Aug 4, 2020
Apparatus and method for testing semiconductor device and system comprising the same
SAMSUNG ELECTRONICS CO LTD3 citations72
US7671617B2Mar 2, 2010
Test system to test multi-chip package compensating a signal distortion
SAMSUNG ELECTRONICS CO LTD7 citations72
US10855185B2Dec 1, 2020
Semiconductor circuit including a DC-DC converter and a voltage regulator
SAMSUNG ELECTRONICS CO LTD4 citations70
US9759769B2Sep 12, 2017
Rechargeable power module and test system including the same
SAMSUNG ELECTRONICS CO LTD2 citations70
US9513333B2Dec 6, 2016
Test interface board and test system including the same
SAMSUNG ELECTRONICS CO LTD3 citations70
US7755449B2Jul 13, 2010
Printed circuit board having impedance-matched strip transmission line
SAMSUNG ELECTRONICS CO LTD3 citations61
US10551434B2Feb 4, 2020
Rechargeable power module and test system including the same
SAMSUNG ELECTRONICS CO LTD1 citations60
US12287367B2Apr 29, 2025
Test board and test device including the same
SAMSUNG ELECTRONICS CO LTD0 citations58
US8832638B2Sep 9, 2014
Package test devices having a printed circuit board
SAMSUNG ELECTRONICS CO LTD0 citations49
US10203369B2Feb 12, 2019
Test board, test equipment, test system, and test method
SAMSUNG ELECTRONICS CO LTD0 citations48
US9612276B2Apr 4, 2017
Test device and test system including the same
SAMSUNG ELECTRONICS CO LTD0 citations47
US10816594B2Oct 27, 2020
Apparatus for testing a signal speed of a semiconductor package and method of manufacturing a semiconductor package
SAMSUNG ELECTRONICS CO LTD0 citations40
SONG KI-JAE
3 patentsUS8872531B2Oct 28, 2014
Semiconductor device and test apparatus including the same
SONG KI-JAE6 citations66
US8106675B2Jan 31, 2012
Test system
SONG KI-JAE4 citations57
US8482308B2Jul 9, 2013
Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same
SONG KI-JAE0 citations38