Inventor

OKA KENJI

JP71 patents

⚠️ This page may combine multiple inventors who share the name “OKA KENJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OKA KENJI

HITACHI LTD

Defect inspection method and apparatus

Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected

Method and apparatus for observing and inspecting defects

Defect inspection method and apparatus therefor

Automatic focus detection method, automatic focus detection apparatus, and inspection apparatus

Method and apparatus for processing inspection data

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected

Method of inspecting a semiconductor device and an apparatus thereof

Defect inspection method and apparatus

Method and apparatus for picking up 2D image of an object to be sensed

Defect inspection method and apparatus therefor

Method and apparatus for picking up 2D image of an object to be sensed

Method and apparatus for observing and inspecting defects

Defect inspection method and apparatus

Method of inspecting a semiconductor device and an apparatus thereof

Defect inspection method and apparatus

Method of inspecting a semiconductor device and an apparatus thereof

Method and apparatus for observing and inspecting defects

FUJITSU TEN LTD

Monopulse radar apparatus and antenna switch

Target detection system using radar and image processing

Radar apparatus and failure detection method thereof

Ranging device utilizing image processing

Ranging device utilizing image processing

Antenna apparatus

HITACHI HIGH TECH CORP

Method of inspecting a semiconductor device and an apparatus thereof

Appearance inspection apparatus

Appearance inspection apparatus

Appearance inspection apparatus

RENESAS TECH CORP

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected

Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected

TSUKIZAWA SOTARO

Pupil detection device and pupil detection method

External light glare assessment device, line of sight detection device and external light glare assessment method

Pupil detection device and pupil detection method

OKA KENJI

Appearance inspection apparatus

Appearance inspection apparatus

DAICEL CHEM

Process for preparation of aliphatic diisocyanate compounds

Process for preparation of isocyanate compounds

HITACHI HIGH TECH ELECT ENG CO

Method of inspecting a semiconductor device and an apparatus thereof

MAEDA SHUNJI

Defect inspection method and apparatus

MAZDA MOTOR

Lean burn engine for automobile

NICHIA CORP

Method for manufacturing semiconductor light emitting device

WAKAI YOHEI

Semiconductor light emitting device and method for manufacturing the same

PANASONIC CORP

Dielectric porcelain composition, and method for manufacturing capacitor using the same

NEMOTO KAZUNORI

Inspecting apparatus and an inspecting method

HAMAMATSU AKIRA

Method of inspecting a semiconductor device and an apparatus thereof

TOKICO LTD

Reciprocating device

LENOVO SINGAPORE PTE LTD

Verifying integrity of backup file in a multiple operating system environment

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Process for producing laminated ceramic capacitor