Inventor
VAN HORN JOSEPH J
US3 patents
Patents
3 patentsUS6275051B1Aug 14, 2001
Segmented architecture for wafer test and burn-in
IBM127 citations96
US5519193AMay 21, 1996
Method and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiation
IBM26 citations86
US6747472B2Jun 8, 2004
Temporary device attach structure for test and burn in of microjoint interconnects and method for fabricating the same
IBM8 citations72