Inventor
KOBAYASHI YOSHIHITO
JP39 patents
⚠️ This page may combine multiple inventors who share the name “KOBAYASHI YOSHIHITO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
21 patentsUS6445203B1Sep 3, 2002
Electric device testing apparatus
ADVANTEST CORP103 citations98
US6066822AMay 23, 2000
Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus
ADVANTEST CORP94 citations97
US6104183AAug 15, 2000
Semiconductor device testing apparatus
ADVANTEST CORP62 citations96
US6075216AJun 13, 2000
Device transfer and reinspection method for IC handler
ADVANTEST CORP64 citations96
US6437593B1Aug 20, 2002
Electric device testing apparatus and electric device testing method
ADVANTEST CORP29 citations93
US6320398B1Nov 20, 2001
Semiconductor device testing apparatus
ADVANTEST CORP30 citations93
US5772387AJun 30, 1998
Device transfer apparatus and device reinspection method for IC handler
ADVANTEST CORP43 citations93
US5635832AJun 3, 1997
IC carrier for use with an IC handler
ADVANTEST CORP41 citations93
US7800393B2Sep 21, 2010
Electronic device test apparatus for successively testing electronic devices
ADVANTEST CORP15 citations92
US7612575B2Nov 3, 2009
Electronic device test apparatus for successively testing electronic devices
ADVANTEST CORP17 citations92
US6856128B2Feb 15, 2005
Semiconductor device testing apparatus and a test tray for use in the testing apparatus
ADVANTEST CORP19 citations92
US6728652B1Apr 27, 2004
Method of testing electronic components and testing apparatus for electronic components
ADVANTEST CORP26 citations92
US6433294B1Aug 13, 2002
Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus
ADVANTEST CORP21 citations92
US6384360B1May 7, 2002
IC pickup, IC carrier and IC testing apparatus using the same
ADVANTEST CORP24 citations92
US6384593B1May 7, 2002
Semiconductor device testing apparatus
ADVANTEST CORP40 citations92
US5625287AApr 29, 1997
Test tray positioning stopper mechanism for automatic handler
ADVANTEST CORP23 citations92
US6406246B1Jun 18, 2002
Device handler
ADVANTEST CORP43 citations91
US5261775ANov 16, 1993
IC test equipment
ADVANTEST CORP15 citations74
US6459259B1Oct 1, 2002
Tester for semiconductor devices and test tray used for the same
ADVANTEST CORP13 citations73
US5973493AOct 26, 1999
Test tray positioning stopper mechanism for automatic handler
ADVANTEST CORP6 citations73
USD431580SOct 3, 2000
IC tray holder
ADVANTEST CORP0 citations52
TOSHIBA KK
10 patentsUS5403695AApr 4, 1995
Resist for forming patterns comprising an acid generating compound and a polymer having acid decomposable groups
TOSHIBA KK83 citations96
US5326675AJul 5, 1994
Pattern forming method including the formation of an acidic coating layer on the radiation-sensitive layer
TOSHIBA KK49 citations96
USRE35821EJun 9, 1998
Pattern forming method including the formation of an acidic coating layer on the radiation-sensitive layer
TOSHIBA KK23 citations92
US5279921AJan 18, 1994
Pattern formation resist and pattern formation method
TOSHIBA KK25 citations92
US5100768AMar 31, 1992
Photosensitive composition
TOSHIBA KK34 citations92
US5580702ADec 3, 1996
Method for forming resist patterns
TOSHIBA KK31 citations89
US5814432ASep 29, 1998
Method of forming patterns for use in manufacturing electronic devices
TOSHIBA KK18 citations84
US9599909B2Mar 21, 2017
Electrostatic chuck cleaner, cleaning method, and exposure apparatus
TOSHIBA KK2 citations73
US9348218B2May 24, 2016
Mask cleaner and cleaning method
TOSHIBA KK3 citations73
US5091282AFeb 25, 1992
Alkali soluble phenol polymer photosensitive composition
TOSHIBA KK4 citations63
KOBAYASHI YOSHIHITO
3 patentsUS8551393B2Oct 8, 2013
Patterning method and method for manufacturing semiconductor device
KOBAYASHI YOSHIHITO3 citations60
US8663895B2Mar 4, 2014
Method for manufacturing template and method for manufacturing semiconductor device
KOBAYASHI YOSHIHITO0 citations50
US9808841B2Nov 7, 2017
Reticle chuck cleaner and reticle chuck cleaning method
KOBAYASHI YOSHIHITO1 citations48