P

Inventor

MATSUYAMA YUKIO

JP17 patents
⚠️ This page may combine multiple inventors who share the name “MATSUYAMA YUKIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

14 patents
US5986263ANov 16, 1999

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

HITACHI LTD164 citations99
US6587581B1Jul 1, 2003

Visual inspection method and apparatus therefor

HITACHI LTD118 citations98
US6172365B1Jan 9, 2001

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

HITACHI LTD48 citations96
US5293538AMar 8, 1994

Method and apparatus for the inspection of defects

HITACHI LTD80 citations96
US5780866AJul 14, 1998

Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection

HITACHI LTD62 citations95
US4628531ADec 9, 1986

Pattern checking apparatus

HITACHI LTD100 citations95
US6717142B2Apr 6, 2004

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

HITACHI LTD16 citations93
US6373054B2Apr 16, 2002

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

HITACHI LTD23 citations93
US6249598B1Jun 19, 2001

Solder testing apparatus

HITACHI LTD21 citations92
US6333992B1Dec 25, 2001

Defect judgement processing method and apparatus

HITACHI LTD47 citations91
US5763123AJun 9, 1998

Method for producing thin-film substrate

HITACHI LTD27 citations91
US4860371AAug 22, 1989

Method and apparatus for detecting pattern defects

HITACHI LTD40 citations91
US6828554B2Dec 7, 2004

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

HITACHI LTD11 citations82
US7122796B2Oct 17, 2006

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

HITACHI LTD4 citations74

NEC CORP

2 patents

JAPAN AVIATION ELECTRON

1 patent