Inventor
HUYNH DUC
AU20 patents
⚠️ This page may combine multiple inventors who share the name “HUYNH DUC”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LOCKHEED CORP
10 patentsUS9720055B1Aug 1, 2017
Magnetometer with light pipe
LOCKHEED CORP71 citations97
US9551763B1Jan 24, 2017
Diamond nitrogen vacancy sensor with common RF and magnetic fields generator
LOCKHEED CORP94 citations97
US10126377B2Nov 13, 2018
Magneto-optical defect center magnetometer
LOCKHEED CORP21 citations93
US9817081B2Nov 14, 2017
Magnetometer with light pipe
LOCKHEED CORP33 citations93
US10677953B2Jun 9, 2020
Magneto-optical detecting apparatus and methods
LOCKHEED CORP30 citations90
US9823313B2Nov 21, 2017
Diamond nitrogen vacancy sensor with circuitry on diamond
LOCKHEED CORP13 citations84
US9093442B1Jul 28, 2015
Apparatus and method for achieving wideband RF performance and low junction to case thermal resistance in non-flip bump RFIC configuration
LOCKHEED CORP7 citations84
US10459041B2Oct 29, 2019
Magnetic detection system with highly integrated diamond nitrogen vacancy sensor
LOCKHEED CORP12 citations82
US10520558B2Dec 31, 2019
Diamond nitrogen vacancy sensor with nitrogen-vacancy center diamond located between dual RF sources
LOCKHEED CORP3 citations73
US10935611B2Mar 2, 2021
Magnetometer apparatus
LOCKHEED CORP1 citations59
PAVEMENT MARKING TECHN
3 patentsUS5529433AJun 25, 1996
Apparatus and method for marking a surface
PAVEMENT MARKING TECHN108 citations96
US5486067AJan 23, 1996
Apparatus and method for marking a surface
PAVEMENT MARKING TECHN153 citations96
US5529432AJun 25, 1996
Apparatus and method for marking a surface
PAVEMENT MARKING TECHN27 citations89
SYNOPSYS INC
3 patentsUS11288426B2Mar 29, 2022
Analyzing delay variations and transition time variations for electronic circuits
SYNOPSYS INC0 citations61
US10783301B2Sep 22, 2020
Analyzing delay variations and transition time variations for electronic circuits
SYNOPSYS INC0 citations50
US10255395B2Apr 9, 2019
Analyzing delay variations and transition time variations for electronic circuits
SYNOPSYS INC0 citations50