Inventor
LIN YOU-HSIEN
CN11 patents
⚠️ This page may combine multiple inventors who share the name “LIN YOU-HSIEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHANGXIN MEMORY TECH INC
6 patentsUS11408929B2Aug 9, 2022
Through-silicon via detecting circuit, method and integrated circuit having the same
CHANGXIN MEMORY TECH INC0 citations59
US11531057B2Dec 20, 2022
Through-silicon via crack detecting apparatus, detecting method, and semiconductor device fabrication method having the same
CHANGXIN MEMORY TECH INC0 citations50
US11994553B2May 28, 2024
Signal transmission circuit and method, and integrated circuit (IC)
CHANGXIN MEMORY TECH INC0 citations48
US11114417B2Sep 7, 2021
Through-silicon via (TSV) test circuit, TSV test method and integrated circuits (IC) chip
CHANGXIN MEMORY TECH INC0 citations48
US11614481B2Mar 28, 2023
Through-silicon via detecting circuit, detecting methods and integrated circuit thereof
CHANGXIN MEMORY TECH INC0 citations44
US11852657B2Dec 26, 2023
Tester and method for calibrating probe card and device under testing (DUT)
CHANGXIN MEMORY TECH INC0 citations40