P

Inventor

WOLFLING SHAY

IL11 patents
⚠️ This page may combine multiple inventors who share the name “WOLFLING SHAY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NOVA MEASURING INSTR LTD

4 patents
US10209206B2Feb 19, 2019

Method and system for determining strain distribution in a sample

NOVA MEASURING INSTR LTD6 citations72
US10054423B2Aug 21, 2018

Optical method and system for critical dimensions and thickness characterization

NOVA MEASURING INSTR LTD2 citations72
US10876959B2Dec 29, 2020

Method and system for optical characterization of patterned samples

NOVA MEASURING INSTR LTD2 citations70
US10311198B2Jun 4, 2019

Overlay design optimization

NOVA MEASURING INSTR LTD0 citations41

ICOS VISION SYSTEMS NV

3 patents
US7327470B2Feb 5, 2008

Spatial and spectral wavefront analysis and measurement

ICOS VISION SYSTEMS NV14 citations92
US7609388B2Oct 27, 2009

Spatial wavefront analysis and 3D measurement

ICOS VISION SYSTEMS NV28 citations86
US7542144B2Jun 2, 2009

Spatial and spectral wavefront analysis and measurement

ICOS VISION SYSTEMS NV4 citations56

NANO OR TECHNOLOGIES INC

1 patent
US6819435B2Nov 16, 2004

Spatial and spectral wavefront analysis and measurement

NANO OR TECHNOLOGIES INC16 citations89

NANO OR TECHNOLOGIES ISRAEL LT

1 patent
US6707608B1Mar 16, 2004

Diffractive optical element and a method for producing same

NANO OR TECHNOLOGIES ISRAEL LT26 citations88

NOVA LTD

1 patent
US11885737B2Jan 30, 2024

Method and system for optical characterization of patterned samples

NOVA LTD1 citations59

ARIELI YOEL

1 patent
US8319975B2Nov 27, 2012

Methods and apparatus for wavefront manipulations and improved 3-D measurements

ARIELI YOEL0 citations42