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Inventor
YACHINI MICHAL HAIM
IL
2 patents
⚠️ This page may combine multiple inventors who share the name “YACHINI MICHAL HAIM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NOVA MEASURING INSTR LTD
1 patent
US10876959B2
Dec 29, 2020
Method and system for optical characterization of patterned samples
NOVA MEASURING INSTR LTD
2 citations
70
NOVA LTD
1 patent
US11885737B2
Jan 30, 2024
Method and system for optical characterization of patterned samples
NOVA LTD
1 citations
59