Inventor
FROELICH DANIEL S
US26 patents
⚠️ This page may combine multiple inventors who share the name “FROELICH DANIEL S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
14 patentsUS10534034B2Jan 14, 2020
Interconnect retimer enhancements
INTEL CORP6 citations84
US11327861B2May 10, 2022
Cross-talk generation in a multi-lane link during lane testing
INTEL CORP2 citations73
US10860449B2Dec 8, 2020
Adjustable retimer buffer
INTEL CORP3 citations73
US10853212B2Dec 1, 2020
Cross-talk generation in a multi-lane link during lane testing
INTEL CORP3 citations73
US11630480B2Apr 18, 2023
System, method, and apparatus for SRIS mode selection for PCIe
INTEL CORP2 citations72
US10671476B2Jun 2, 2020
In-band margin probing on an operational interconnect
INTEL CORP2 citations68
US12135581B2Nov 5, 2024
System, method, and apparatus for SRIS mode selection for PCIE
INTEL CORP0 citations62
US11675003B2Jun 13, 2023
Interconnect retimer enhancements
INTEL CORP0 citations62
US11288154B2Mar 29, 2022
Adjustable retimer buffer
INTEL CORP0 citations62
US9262347B2Feb 16, 2016
Method, apparatus and system for measuring latency in a physical unit of a circuit
INTEL CORP2 citations62
US11157350B2Oct 26, 2021
In-band margin probing on an operational interconnect
INTEL CORP0 citations58
US9779053B2Oct 3, 2017
Physical interface for a serial interconnect
INTEL CORP0 citations52
US9558145B2Jan 31, 2017
Method, apparatus and system for measuring latency in a physical unit of a circuit
INTEL CORP1 citations52
US9552269B2Jan 24, 2017
Test logic for a serial interconnect
INTEL CORP0 citations52
TEKTRONIX INC
11 patentsUS11940483B2Mar 26, 2024
Systems, methods and devices for high-speed input/output margin testing
TEKTRONIX INC2 citations69
US11782809B2Oct 10, 2023
Test and measurement system for analyzing devices under test
TEKTRONIX INC2 citations69
US12055584B2Aug 6, 2024
Systems, methods, and devices for high-speed input/output margin testing
TEKTRONIX INC0 citations61
US11927627B2Mar 12, 2024
Systems, methods, and devices for high-speed input/output margin testing
TEKTRONIX INC0 citations61
US12504466B2Dec 23, 2025
Automated recognition of a device under test
TEKTRONIX INC0 citations59
US12216558B2Feb 4, 2025
Test and measurement system for analyzing devices under test
TEKTRONIX INC0 citations59
US12061232B2Aug 13, 2024
Margin test data tagging and predictive expected margins
TEKTRONIX INC0 citations59
US12055603B2Aug 6, 2024
Cable condition indicator
TEKTRONIX INC0 citations59
US12117486B2Oct 15, 2024
Systems, methods and devices for high-speed input/output margin testing
TEKTRONIX INC0 citations57
US11946970B2Apr 2, 2024
Systems, methods and devices for high-speed input/output margin testing
TEKTRONIX INC0 citations57
US12480974B2Nov 25, 2025
Multiplexer-enabled cables and test fixtures
TEKTRONIX INC0 citations48