P

Inventor

YANG MICHAEL X

US83 patents
⚠️ This page may combine multiple inventors who share the name “YANG MICHAEL X”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

35 patents
US6951804B2Oct 4, 2005

Formation of a tantalum-nitride layer

APPLIED MATERIALS INC106 citations99
US6998014B2Feb 14, 2006

Apparatus and method for plasma assisted deposition

APPLIED MATERIALS INC167 citations98
US6939804B2Sep 6, 2005

Formation of composite tungsten films

APPLIED MATERIALS INC116 citations98
US6911391B2Jun 28, 2005

Integration of titanium and titanium nitride layers

APPLIED MATERIALS INC77 citations98
US6720027B2Apr 13, 2004

Cyclical deposition of a variable content titanium silicon nitride layer

APPLIED MATERIALS INC104 citations98
US6660126B2Dec 9, 2003

Lid assembly for a processing system to facilitate sequential deposition techniques

APPLIED MATERIALS INC128 citations98
US6423949B1Jul 23, 2002

Multi-zone resistive heater

APPLIED MATERIALS INC534 citations98
US7745333B2Jun 29, 2010

Methods for depositing tungsten layers employing atomic layer deposition techniques

APPLIED MATERIALS INC47 citations97
US6809026B2Oct 26, 2004

Selective deposition of a barrier layer on a metal film

APPLIED MATERIALS INC92 citations97
US6734020B2May 11, 2004

Valve control system for atomic layer deposition chamber

APPLIED MATERIALS INC135 citations97
US7405158B2Jul 29, 2008

Methods for depositing tungsten layers employing atomic layer deposition techniques

APPLIED MATERIALS INC105 citations96
US7094680B2Aug 22, 2006

Formation of a tantalum-nitride layer

APPLIED MATERIALS INC59 citations96
US7094685B2Aug 22, 2006

Integration of titanium and titanium nitride layers

APPLIED MATERIALS INC34 citations96
US7026238B2Apr 11, 2006

Reliability barrier integration for Cu application

APPLIED MATERIALS INC99 citations96
US6939801B2Sep 6, 2005

Selective deposition of a barrier layer on a dielectric material

APPLIED MATERIALS INC56 citations96
US6645884B1Nov 11, 2003

Method of forming a silicon nitride layer on a substrate

APPLIED MATERIALS INC61 citations96
US7605083B2Oct 20, 2009

Formation of composite tungsten films

APPLIED MATERIALS INC39 citations95
US6827978B2Dec 7, 2004

Deposition of tungsten films

APPLIED MATERIALS INC109 citations95
US6797340B2Sep 28, 2004

Method for depositing refractory metal layers employing sequential deposition techniques

APPLIED MATERIALS INC167 citations95
US7473638B2Jan 6, 2009

Plasma-enhanced cyclic layer deposition process for barrier layers

APPLIED MATERIALS INC20 citations93
US6218301B1Apr 17, 2001

Deposition of tungsten films from W(CO)6

APPLIED MATERIALS INC23 citations93
US7670465B2Mar 2, 2010

Anolyte for copper plating

APPLIED MATERIALS INC33 citations92
US7384867B2Jun 10, 2008

Formation of composite tungsten films

APPLIED MATERIALS INC16 citations92
US7223323B2May 29, 2007

Multi-chemistry plating system

APPLIED MATERIALS INC44 citations92
US7128823B2Oct 31, 2006

Anolyte for copper plating

APPLIED MATERIALS INC16 citations92
US6646235B2Nov 11, 2003

Multi-zone resistive heater

APPLIED MATERIALS INC43 citations92
US6530992B1Mar 11, 2003

Method of forming a film in a chamber and positioning a substitute in a chamber

APPLIED MATERIALS INC40 citations92
US7514353B2Apr 7, 2009

Contact metallization scheme using a barrier layer over a silicide layer

APPLIED MATERIALS INC37 citations90
US7201803B2Apr 10, 2007

Valve control system for atomic layer deposition chamber

APPLIED MATERIALS INC21 citations90
US6699380B1Mar 2, 2004

Modular electrochemical processing system

APPLIED MATERIALS INC28 citations86
US7732325B2Jun 8, 2010

Plasma-enhanced cyclic layer deposition process for barrier layers

APPLIED MATERIALS INC8 citations84
US7779784B2Aug 24, 2010

Apparatus and method for plasma assisted deposition

APPLIED MATERIALS INC8 citations83
US7247222B2Jul 24, 2007

Electrochemical processing cell

APPLIED MATERIALS INC18 citations82
US7781326B2Aug 24, 2010

Formation of a tantalum-nitride layer

APPLIED MATERIALS INC4 citations74
US6455421B1Sep 24, 2002

Plasma treatment of tantalum nitride compound films formed by chemical vapor deposition

APPLIED MATERIALS INC13 citations74

MATTSON TECH INC

14 patents
US10269574B1Apr 23, 2019

Surface treatment of carbon containing films using organic radicals

MATTSON TECH INC12 citations93
US11062910B2Jul 13, 2021

Surface treatment of silicon or silicon germanium surfaces using organic radicals

MATTSON TECH INC4 citations84
US10804109B2Oct 13, 2020

Surface treatment of silicon and carbon containing films by remote plasma with organic precursors

MATTSON TECH INC6 citations84
US10354883B2Jul 16, 2019

Surface treatment of silicon or silicon germanium surfaces using organic radicals

MATTSON TECH INC4 citations84
US10403492B1Sep 3, 2019

Integration of materials removal and surface treatment in semiconductor device fabrication

MATTSON TECH INC8 citations83
US11495437B2Nov 8, 2022

Surface pretreatment process to improve quality of oxide films produced by remote plasma

MATTSON TECH INC4 citations73
US11387111B2Jul 12, 2022

Processing of workpieces with reactive species generated using alkyl halide

MATTSON TECH INC4 citations73
US11289323B2Mar 29, 2022

Processing of semiconductors using vaporized solvents

MATTSON TECH INC4 citations73
US11164725B2Nov 2, 2021

Generation of hydrogen reactive species for processing of workpieces

MATTSON TECH INC3 citations73
US10950428B1Mar 16, 2021

Method for processing a workpiece

MATTSON TECH INC4 citations73
US10573532B2Feb 25, 2020

Method for processing a workpiece using a multi-cycle thermal treatment process

MATTSON TECH INC2 citations73
US11043393B2Jun 22, 2021

Ozone treatment for selective silicon nitride etch over silicon

MATTSON TECH INC5 citations72
US11276560B2Mar 15, 2022

Spacer etching process

MATTSON TECH INC4 citations71
US11387115B2Jul 12, 2022

Silicon mandrel etch after native oxide punch-through

MATTSON TECH INC4 citations70

CARDIVASCULAR SYSTEMS

1 patent

Showing the top 50 of 83 patents by PatentIndex Score.