Inventor
KASTRUP LARS
DE15 patents
⚠️ This page may combine multiple inventors who share the name “KASTRUP LARS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ABBERIOR INSTRUMENTS GMBH
12 patentsUS9632297B1Apr 25, 2017
Device for separately modulating the wave fronts of two components of a light beam and microscope comprising the device
ABBERIOR INSTRUMENTS GMBH7 citations81
US12111455B2Oct 8, 2024
Detecting movements of a sample with respect to an objective
ABBERIOR INSTRUMENTS GMBH2 citations70
US10795140B2Oct 6, 2020
Method, device and laser scanning microscope for generating rasterized images
ABBERIOR INSTRUMENTS GMBH4 citations70
US10386621B2Aug 20, 2019
Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope
ABBERIOR INSTRUMENTS GMBH2 citations70
US11947097B2Apr 2, 2024
Bandpass filter for light having variable lower and upper cut-off wavelengths
ABBERIOR INSTRUMENTS GMBH0 citations59
US11131630B2Sep 28, 2021
Method of aligning a laser-scanning fluorescence microscope and laser-scanning fluorescence microscope having an automatic aligning system
ABBERIOR INSTRUMENTS GMBH1 citations56
US12535416B2Jan 27, 2026
Method, light microscope and computer program for determining a reference time point
ABBERIOR INSTRUMENTS GMBH0 citations49
US12523607B2Jan 13, 2026
Method and fluorescence microscope for determining the location of individual fluorescent dye molecules by means of adaptive scanning
ABBERIOR INSTRUMENTS GMBH0 citations49
US12461009B2Nov 4, 2025
Method and microscope for recording trajectories of individual particles in a sample
ABBERIOR INSTRUMENTS GMBH0 citations49
US12352943B2Jul 8, 2025
Method and device for illuminating a sample in a microscope in points
ABBERIOR INSTRUMENTS GMBH0 citations49
US12259329B2Mar 25, 2025
Method of disturbance correction, and laser scanning microscope having disturbance correction
ABBERIOR INSTRUMENTS GMBH0 citations49
US12055728B2Aug 6, 2024
Method and light microscope for a high-resolution examination of a sample
ABBERIOR INSTRUMENTS GMBH0 citations49