Inventor
JANG WONJIN
US3 patents
Patents
3 patentsUS7301362B2Nov 27, 2007
Duplicated double checking production rule set for fault-tolerant electronics
CALIFORNIA INST OF TECHN23 citations89
US7721183B2May 18, 2010
Method and apparatus for providing SEU-tolerant circuits
CALIFORNIA INST OF TECHN4 citations60
US7999567B2Aug 16, 2011
SEU tolerant arbiter
CALIFORNIA INST OF TECHN0 citations49