P

Inventor

WU TE-HUNG

TW11 patents
⚠️ This page may combine multiple inventors who share the name “WU TE-HUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

6 patents
US6536130B1Mar 25, 2003

Overlay mark for concurrently monitoring alignment accuracy, focus, leveling and astigmatism and method of application thereof

UNITED MICROELECTRONICS CORP24 citations87
US7913196B2Mar 22, 2011

Method of verifying a layout pattern

UNITED MICROELECTRONICS CORP3 citations61
US7669153B2Feb 23, 2010

Method for correcting photomask pattern

UNITED MICROELECTRONICS CORP5 citations61
US7664614B2Feb 16, 2010

Method of inspecting photomask defect

UNITED MICROELECTRONICS CORP3 citations59
US8042069B2Oct 18, 2011

Method for selectively amending layout patterns

UNITED MICROELECTRONICS CORP3 citations57
US7886254B2Feb 8, 2011

Method for amending layout patterns

UNITED MICROELECTRONICS CORP1 citations49

HUANG CHUN-HSIEN

2 patents
US8151221B2Apr 3, 2012

Method to compensate optical proximity correction

HUANG CHUN-HSIEN6 citations81
US8321820B2Nov 27, 2012

Method to compensate optical proximity correction

HUANG CHUN-HSIEN3 citations60

WU TE-HUNG

2 patents
US8166424B2Apr 24, 2012

Method for constructing OPC model

WU TE-HUNG0 citations44
US8225237B2Jul 17, 2012

Method to determine process window

WU TE-HUNG0 citations33

YANG YU-SHIANG

1 patent
US8321822B2Nov 27, 2012

Method and computer-readable medium of optical proximity correction

YANG YU-SHIANG2 citations59