Inventor
CHEN TZU-YANG
TW4 patents
Patents
4 patentsUSD983681SApr 18, 2023
Probe for testing device under test
MPI CORP0 citations53
US11493536B2Nov 8, 2022
Probe head with linear probe
MPI CORP0 citations43
US11143674B2Oct 12, 2021
Probe head with linear probe
MPI CORP0 citations38
US9638716B2May 2, 2017
Positioner of probe card and probe head of probe card
MPI CORP0 citations37